by Kuech, T.F., Marshall, E., Scilla, G.J., Potemski, R., Ransom, C.M., Hung, M.Y.
Published in Journal of crystal growth (01.09.1986)

by Ransom, C.M., Jackson, T.N., DeGelormo, J.F.
Published in IEEE transactions on electron devices (01.12.1991)

by Jackson, T.N., Ransom, C.M., DeGelormo, J.F.
Published in IEEE electron device letters (01.11.1991)

by Bellone, S., Busatto, G., Ransom, C.M.
Published in IEEE transactions on electron devices (01.03.1991)

by Spirito, P., Bellone, S., Ransom, C.M., Busatto, G., Cocorullo, G.
Published in IEEE electron device letters (01.01.1989)

by Ransom, C.M., Jackson, T.N., DeGelormo, J.F.
Published in [1991] 49th Annual Device Research Conference Digest (1991)

by Spirito, P., Ransom, C.M., Oehrlein, G.S.
Published in Solid-state electronics (01.06.1986)

by Bellone, S., Busatto, G., Ransom, C.M.
Published in Proceedings of the 1989 International Conference on Microelectronic Test Structures (1989)

by Spirito, P., Bellone, S., Ransom, C.M., Busatto, G., Cocorullo, G.
Published in Proceedings of the 1989 International Conference on Microelectronic Test Structures (1989)