by Redford, M., Fallon, M., Shafi, Z.A., McGinty, J., Rankin, N.S., Walton, A.J.
Published in IWSM. 1998 3rd International Workshop on Statistical Metrology (Cat. No.98EX113) (1998)

by Munro, C.G., Gundlach, A.M., Stevenson, J.T.M., Travis, D.W., Smith, S., Rankin, N.S., Walton, A.J.
Published in ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) (1999)

by Rankin, N.S., Chun Ng, Leang Sern Ee, Boyland, F., Quek, E., Leung Ying Keung, Walton, A.J., Redford, M.
Published in ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) (2001)