Influence of Annealing, Oxidation and Doping on Conduction-Band near Interface Traps in 4H-SiC Characterized by Low Temperature Conductance Measurements
Grieb, Michael, Scholten, Dick, Rambach, Martin, Noll, Stefan, Frey, Lothar, Bauer, Anton J.
Published in Materials science forum (30.06.2015)
Published in Materials science forum (30.06.2015)
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