(Invited) Advanced (Millisecond) Annealing in Silicon Based Semiconductor Manufacturing
Govindaraju, Sridhar, Shih, Chen-luen, Ramanarayanan, Panchapakesan, Lin, Yi-Hung, Knutson, Karson
Published in ECS transactions (01.01.2010)
Published in ECS transactions (01.01.2010)
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Journal Article
Low-k ILD reliability through chip-package assembly: Engineering appropriate stress tests and process certification criteria
Rangaraj, Sudarshan, Hicks, Jeffrey, O'Day, Michael, Aggarwal, Ankur, Wilson, Terri, Panchapakesan, Ramanarayanan, Grover, Rohit, Guotao Wang
Published in 2013 IEEE 63rd Electronic Components and Technology Conference (01.05.2013)
Published in 2013 IEEE 63rd Electronic Components and Technology Conference (01.05.2013)
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Conference Proceeding
VERTICAL SEMICONDUCTOR WAFER CARRIER
TOLCHINSKY PETER G, RAMANARAYANAN PANCHAPAKESAN, PARKER CHRISTOPHER, KNUTSON KARSON
Year of Publication 19.03.2009
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Year of Publication 19.03.2009
Patent
APPARATUS TO REDUCE WAFER EDGE TEMPERATURE AND BREAKAGE OF WAFERS
HWANG JACK, LEONARD JOHN, RAMANARAYANAN PANCHAPAKESAN, KNUTSON KARSON, GOVINDARAJU SRIDHAR
Year of Publication 02.10.2008
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Year of Publication 02.10.2008
Patent
Point defect energetics in silicon using the LDA+U method
Panchapakesan Ramanarayanan, Sabirianov, Renat F, Cho, Kyeongjae
Published in arXiv.org (26.10.2003)
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Published in arXiv.org (26.10.2003)
Paper