BTI-induced aging under random stress waveforms: Modeling, simulation and silicon validation
Sutaria, Ketul, Ramkumar, Athul, Rongjun Zhu, Rajeev, Renju, Yao Ma, Yu Cao
Published in 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) (01.06.2014)
Published in 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) (01.06.2014)
Get full text
Conference Proceeding