SMART: Selective MAC zero-optimization for neural network reliability under radiation
Rajappa, Anuj Justus, Reiter, Philippe, Sartori, Tarso Kraemer Sarzi, Laurini, Luiz Henrique, Fourati, Hassen, Mercelis, Siegfried, Famaey, Jeroen, Bastos, Rodrigo Possamai
Published in Microelectronics and reliability (01.11.2023)
Published in Microelectronics and reliability (01.11.2023)
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