by CHEN, Yu-Sheng, LEE, Heng-Yuan, CHEN, Frederick, TSAI, Ming-Jinn, KU, Tzu-Kun, CHEN, Pang-Shiu, CHEN, Wei-Su, TSAI, Kan-Hsueh, GU, Pei-Yi, WU, Tai-Yuan, TSAI, Chen-Han, RAHAMAN, S. Z, LIN, Yu-De
Published in IEEE electron device letters (01.02.2014)

by Maikap, S, Rahaman, S Z, Tien, T C
Published in Nanotechnology (22.10.2008)

by Yu-Sheng Chen, Heng-Yuan Lee, Pang-Shiu Chen, Wei-Su Chen, Kan-Hsueh Tsai, Pei-Yi Gu, Tai-Yuan Wu, Chen-Han Tsai, Rahaman, S. Z., Yu-De Lin, Chen, Frederick, Ming-Jinn Tsai, Tzu-Kun Ku
Published in IEEE electron device letters (01.02.2014)

by Maikap, Siddheswar, Rahaman, S. Z.
Published in ECS transactions (27.04.2012)

by Rahaman, S Z, Maikap, S
Published in 2010 IEEE International Memory Workshop (01.05.2010)

by Maikap, Siddheswar, Rahaman, S. Z.
Published in ECS transactions (27.04.2012)

by Rahaman, S Z, Maikap, S
Published in Microelectronics and reliability (01.05.2010)

by RAHAMAN, S. Z, MAIKAP, S
Published in Microelectronics and reliability (2010)

by Rahaman, S.Z., Maikap, S.
Published in Microelectronics and reliability (01.05.2010)

by Maikap, S, Rahaman, S Z, Tien, T C
Published in Nanotechnology (29.10.2008)

by Maikap, S, Rahaman, S Z, Tien, T C
Published in Nanotechnology (22.10.2008)

by Banerjee, W., Maikap, S., Rahaman, S. Z., Prakash, A., Tien, T.-C., Li, W.-C., Yang, J.-R.
Published in Journal of the Electrochemical Society (2011)

by Rahaman, S Z, Maikap, S, Lin, C.-H, Tzeng, P.-J, Lee, H Y, Wu, T.-Y, Chen, Y S, Chen, F, Kao, M.-J, Tsai, M
Published in Proceedings of 2010 International Symposium on VLSI Technology, System and Application (01.04.2010)

by Rahaman, S. Z., Maikap, S., Chiu, H.-C., Lin, C.-H., Wu, T.-Y., Chen, Y.-S., Tzeng, P.-J., Chen, F., Kao, M.-J., Tsai, M.-J.
Published in Electrochemical and solid-state letters (2010)

by Lin, Y. D., Chen, Y. S., Tsai, K. H., Chen, P. S., Huang, Y. C., Lin, S. H., Gu, P. Y., Chen, W. S., Chen, P. S., Lee, H. Y., Rahaman, S. Z., Hsu, C. H., Chen, F. T., Ku, T. K.
Published in 2015 International Symposium on VLSI Technology, Systems and Applications (01.04.2015)

by Tsai, C.H., Chen, F. T., Lee, H.Y., Chen, Y.S., Tsai, K.H., Wu, T.Y., Rahaman, S.Z., Gu, P.Y., Chen, W. S., Chen, P.S., Lin, Z.H., Tseng, P.L., Lin, W.P., Lin, C.H., Sheu, S.S., Tsai, M. J., Ku, T.K.
Published in ECS transactions (01.01.2013)

by Chen, F. T., Heng-Yuan Lee, Yu-Sheng Chen, Rahaman, S. Z., Chen-Han Tsai, Kan-Hsueh Tsai, Tai-Yuan Wu, Wei-Su Chen, Pei-Yi Gu, Yu-De Lin, Shyh-Shyuan Sheu, Ming-Jinn Tsai, Li-Heng Lee, Tzu-Kun Ku, Pang-Shiu Chen
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)

by Maikap, Siddheswar, Rahaman, S. Z.
Published in Meeting abstracts (Electrochemical Society) (12.04.2012)

by Rahaman, S. Z., Chang, Y.-J., Hsin, Y.-C., Yang, S.-Y., Chen, F.-M., Chen, K.-M., Wang, I-J., Lee, H.-H., Chen, G.-L., Su, Y.-H., Shih, C.-Y., Chiu, S.-C., Wei, J.-H., Yen, S.-C., Huang, K.-C., Chen, C.-C., Chen, M.-C., Sheu, S.-S., Lo, W.-C., Chang, S.-Z., See, Y.-C., Deng, D.-L., Wu, C.-I
Published in 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (18.04.2022)

by Wang, D. Y., Wang, I. J., Lin, C. S., Su, J. W., Lee, H. H., Hsin, Y. C., Yang, S. Y., Chang, Y. J., Kuo, Y. C., Su, Y.H., Rahaman, S. Z., Chen, G. L., Li, S. H., Wei, J. H., Huang, K. C., Wu, C. I.
Published in 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2019)