Integration, BEOL, and Thermal Stress Impact on CMOS-Compatible Titanium-Based Contacts for III-V Devices on a 300-mm Platform
Boyer, F., Dabertrand, K., Jany, C., Gergaud, P., Coudurier, N., Nemouchi, F., Gregoire, M., Rafhay, Q., Rodriguez, Ph
Published in IEEE transactions on electron devices (01.06.2020)
Published in IEEE transactions on electron devices (01.06.2020)
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Journal Article
Simulation Study of the Origin of Ge High Speed Photodetector Degradation
Arunachalam, B., Broquin, J.-E., Rafhay, Q., Roy, D., Kaminski, A.
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
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Conference Proceeding
Investigation of resistance fluctuations in ReRAM: physical origin, temporal dependence and impact on memory reliability
Reganaz, L., Deleruyelle, D., Rafhay, Q., Minguet Lopez, J., Castellani, N., Nodin, J. F., Bricalli, A., Piccolboni, G., Molas, G., Andrieu, F.
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
New parameter extraction method based on split C–V measurements in FDSOI MOSFETs
Ben Akkez, Imed, Cros, Antoine, Fenouillet-Beranger, Claire, Boeuf, Frederic, Rafhay, Q., Balestra, Francis, Ghibaudo, Gérard
Published in Solid-state electronics (01.06.2013)
Published in Solid-state electronics (01.06.2013)
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Journal Article
Conference Proceeding
Variability of Trap-induced Mobility Fluctuations in Nanoscale Bulk and FD-SOI MOSFETs
Gauthier, O., Haendler, S., Rafhay, Q., Theodorou, C.
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
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Conference Proceeding
Characterization and 3D TCAD simulation of NOR-type flash non-volatile memories with emphasis on corner effects
Zaka, A., Singer, J., Dornel, E., Garetto, D., Rideau, D., Rafhay, Q., Clerc, R., Manceau, J.-P., Degors, N., Boccaccio, C., Tavernier, C., Jaouen, H.
Published in Solid-state electronics (01.09.2011)
Published in Solid-state electronics (01.09.2011)
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Journal Article
Conventional Technological Boosters for Injection Velocity in Ultrathin-Body MOSFETs
Ferrier, M., Clerc, R., Lucci, L., Rafhay, Q., Pananakakis, G., Ghibaudo, G., Boeuf, F., Skotnicki, T.
Published in IEEE transactions on nanotechnology (01.11.2007)
Published in IEEE transactions on nanotechnology (01.11.2007)
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Journal Article
Intrinsic Mismatch Between Floating-Gate Nonvolatile Memory Cell and Equivalent Transistor
Duane, R., Rafhay, Q., Beug, M.F., van Duuren, M.
Published in IEEE electron device letters (01.05.2007)
Published in IEEE electron device letters (01.05.2007)
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Journal Article
High temperature stability embedded ReRAM for 2x nm node and beyond
Molas, G., Piccolboni, G., Bricalli, A., Verdy, A., Naot, I., Cohen, Y., Regev, A., Naveh, I., Deleruyelle, D., Rafhay, Q., Castellani, N., Reganaz, L., Persico, A., Segaud, R., Nodin, J. F., Meli, V., Martin, S., Andrieu, F., Grenouillet, L.
Published in 2022 IEEE International Memory Workshop (IMW) (01.05.2022)
Published in 2022 IEEE International Memory Workshop (IMW) (01.05.2022)
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Conference Proceeding
Reliability of CMOS-Compatible Ti / n-InP and Ti / p-InGaAs Ohmic Contacts for Hybrid III-V / Si Lasers
Boyer, F., Jany, C., Da Fonseca, J., Szelag, B., Amalberg, V., Gregoire, M., Rafhay, Q., Rodriguez, Ph
Published in 2019 IEEE 16th International Conference on Group IV Photonics (GFP) (01.08.2019)
Published in 2019 IEEE 16th International Conference on Group IV Photonics (GFP) (01.08.2019)
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Conference Proceeding
Reliability of CMOS-Compatible Ti / n-InP and Ti / p-InGaAs Ohmic Contacts for Hybrid III-V / Si Lasers
Boyer, F., Jany, C., Da Fonseca, J., Szelag, B., Amalbert, V., Gregoire, M., Rafhay, Q., Rodriguez, Ph
Published in 2019 IEEE 16th International Conference on Group IV Photonics (GFP) (01.08.2019)
Published in 2019 IEEE 16th International Conference on Group IV Photonics (GFP) (01.08.2019)
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Conference Proceeding
Modeling of the impact of source/drain regions on short channel effects in MOSFETs
Dutta, T., Rafhay, Q., Pananakakis, G., Ghibaudo, G.
Published in 2013 14th International Conference on Ultimate Integration on Silicon (ULIS) (01.03.2013)
Published in 2013 14th International Conference on Ultimate Integration on Silicon (ULIS) (01.03.2013)
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Conference Proceeding
Experimental characterization of source-to-drain tunneling in 10nm SOI devices
Lolivier, J., Jehl, X., Rafhay, Q., Poiroux, T., Vinet, M., Previtali, B., Sanquer, M., Balestra, F., Deleonibus, S.
Published in 2005 IEEE International SOI Conference Proceedings (2005)
Published in 2005 IEEE International SOI Conference Proceedings (2005)
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Conference Proceeding
On the impact of OxRAM-based synapses variability on convolutional neural networks performance
Garbin, D., Vianello, E., Bichler, O., Azzaz, M., Rafhay, Q., Candelier, P., Gamrat, C., Ghibaudo, G., DeSalvo, B., Perniola, L.
Published in Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH´15) (01.07.2015)
Published in Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH´15) (01.07.2015)
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Conference Proceeding