Scanning white light interferometry in quality control of single-point tape automated bonding
Kassamakov, Ivan Vl, Seppänen, Henri O., Oinonen, Markku J., Hæggström, Edward O., Österberg, J. Mathias, Aaltonen, Juha P., Saarikko, Heimo, Radivojevic, Zoran P.
Published in Microelectronic engineering (2007)
Published in Microelectronic engineering (2007)
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