by Vujić, A., Radenković, S., Nikolić, T., Radišić, D., Trifunov, S., Andrić, A., Markov, Z., Jovičić, S., Stojnić, S. Mudri, Janković, M., Lugonja, P.
Published in Biological conservation (01.06.2016)

by Veloso, A., Jourdain, A., Radisic, D., Chen, R., Arutchelvan, G., O'Sullivan, B., Arimura, H., Stucchi, M., De Keersgieter, A., Hosseini, M., Hopf, T., D'have, K., Wang, S., Dupuy, E., Mannaert, G., Vandersmissen, K., Iacovo, S., Marien, P., Choudhury, S., Schleicher, F., Sebaai, F., Oniki, Y., Zhou, X., Gupta, A., Schram, T., Briggs, B., Lorant, C., Rosseel, E., Hikavyy, A., Loo, R., Geypen, J., Batuk, D., Martinez, G. T., Soulie, J. P., Devriendt, K., Chan, B. T., Demuynck, S., Hiblot, G., Van der Plas, G., Ryckaert, J., Beyer, G., Litta, E. Dentoni, Beyne, E., Horiguchi, N.
Published in IEEE transactions on electron devices (01.12.2022)

by Subramanian, S., Hosseini, M., Chiarella, T., Sarkar, S., Schuddinck, P., Chan, B. T., Radisic, D., Mannaert, G., Hikavyy, A., Rosseel, E., Sebaai, F., Peter, A., Hopf, T., Morin, P., Wang, S., Devriendt, K., Batuk, D., Martinez, G. T., Veloso, A., Litta, E. Dentoni, Baudot, S., Siew, Y. K., Zhou, X., Briggs, B., Capogreco, E., Hung, J., Koret, R., Spessot, A., Ryckaert, J., Demuynck, S., Horiguchi, N., Boemmels, J.
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)

by Le, Q.T., Gül Arslan, E., Rip, J., De Coster, H., Verdonck, P., Radisic, D., Schleicher, F., Vaesen, I., Conard, T., Altamirano-Sanchez, E.
Published in Micro and Nano Engineering (01.06.2023)

by Vega-Gonzalez, Victor, Radisic, D., Chan, Bt, Choudhury, S., Wang, S., Mingardi, A., Le, Q. Toan, Decoster, H., Oniki, Y., Puttarame, P., Vandersmissen, K., Soulie, J.-P., Peter, A., Batuk, A. Sepulveda. D., Martinez, G. T., Richard, O., Boemmels, J., Biesemans, S., Dentoni, E., Horiguchi, N., Park, S., Tokei, Z.
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)

by Vandooren, A., Parihar, N., Franco, J., Loo, R., Arimura, H., Rodriguez, R., Sebaai, F., Iacovo, S., Vandersmissen, K., Li, W., Mannaert, G., Radisic, D., Rosseel, E., Hikavyy, A., Jourdain, A., Mourey, O., Gaudin, G., Reboh, S., Van-Jodin, L. Le, Besnard, G., Neve, C. Roda, Nguyen, B-Y., Radu, I., Litta, E. Dentoni, Horiguchi, N.
Published in 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (12.06.2022)

by Mertens, H., Hosseini, M., Chiarella, T., Zhou, D., Wang, S., Mannaert, G., Dupuy, E., Radisic, D., Tao, Z., Oniki, Y., Hikavyy, A., Rosseel, R., Mingardi, A., Choudhury, S., Gowda, P. Puttarame, Sebaai, F., Peter, A., Vandersmissen, K., Soulie, J.P., Keersgieter, A. De, Lima, L. Petersen Barbosa, Cavalcante, C., Batuk, D., Martinez, G.T., Geypen, J., Seidel, F., Paulussen, K., Favia, P., Boemmels, J., Loo, R., Wong, P., Marquez, A. Sepulveda, Chan, B.T., Mitard, J., Subramanian, S., Demuynck, S., Litta, E. Dentoni, Horiguchi, N., Samavedam, S., Biesemans, S.
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)

by Vandooren, A., Wu, Z., Parihar, N., Franco, J., Parvais, B., Matagne, P., Debruyn, H., Mannaert, G., Devriendt, K., Teugels, L., Vecchio, E., Radisic, D., Rosseel, E., Hikavyy, A., Chan, B. T., Waldron, N., Mitard, J., Besnard, G., Alvarez, A., Gaudin, G., Schwarzenbach, W., Radu, I., Nguyen, B. Y., Huet, K., Tabata, T., Mazzamuto, F., Demuynck, S., Boemmels, J., Collaert, N., Horiguchi, N.
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)

by Veloso, A., Jourdain, A., Radisic, D., Chen, R., Arutchelvan, G., O'Sullivan, B., Arimura, H., Stucchi, M., Keersgieter, A. De, Hosseini, M., Hopf, T., D'Have, K., Wang, S., Dupuy, E., Mannaert, G., Vandersmissen, K., Iacovo, S., Marien, P., Choudhury, S., Schleicher, F., Sebaai, F., Oniki, Y., Zhou, X., Gupta, A., Schram, T., Briggs, B., Lorant, C., Rosseel, E., Hikavyy, A., Loo, R., Geypen, J., Batuk, D., Martinez, G. T., Soulie, J. P., Devriendt, K., Chan, B. T., Demuynck, S., Hiblot, G., der Plas, G. Van, Ryckaert, J., Beyer, G., Litta, E. Dentoni, Beyne, E., Horiguchi, N.
Published in 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (12.06.2022)

by Shamiryan, D., Radisic, D., Boullart, W.
Published in Microelectronic engineering (01.11.2010)

by Tsvetanova, D., Vos, R., Vereecke, G., Parac-Vogt, T. N., Clemente, F., Vanstreels, K., Radisic, D., Conard, T., Franquet, A., Jivanescu, M., Nguyen, D. A. P., Stesmans, A., Brijs, B., Mertens, P., Heyns, M. M.
Published in Journal of the Electrochemical Society (01.01.2011)

by Desfrançois, C, Bouteiller, Y, Schermann, J P, Radisic, D, Stokes, S T, Bowen, K H, Hammer, N I, Compton, R N
Published in Physical review letters (27.02.2004)

by Gutowski, M., Dabkowska, I., Rak, J., Xu, S., Nilles, J.M., Radisic, D., Bowen Jr, K.H.
Published in The European physical journal. D, Atomic, molecular, and optical physics (01.09.2002)

by Xu, S.-J., Nilles, J.M., Radisic, D., Zheng, W.-J., Stokes, S., Bowen, K.H., Becker, R.C., Boustani, I.
Published in Chemical physics letters (26.09.2003)

by XU, S.-J, NILLES, J. M, RADISIC, D, ZHENG, W.-J, STOKES, S, BOWEN, K. H, BECKER, R. C, BOUSTANI, I
Published in Chemical physics letters (26.09.2003)

by Mertens, H., Ritzenthaler, R., Oniki, Y., Gowda, P. Puttarame, Mannaert, G., Sebaai, F., Hikavyy, A., Rosseel, E., Dupuy, E., Peter, A., Vandersmissen, K., Radisic, D., Briggs, B., Batuk, D., Geypen, J., Martinez-Alanis, G., Seidel, F., Richard, O., Chan, B.T., Mitard, J., Litta, E. Dentoni, Horiguchi, N.
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)

by Marien, P., Gonzalez, V. V., Choudhury, S., Radisic, D., Decoster, S., Kundu, S., Hermans, Y., Kenens, B., De Coster, H., Sanchez, E. A., Peter, A., Marquez, A. S., Jourdan, N., Batuk, D., Ryckaert, J., Murdoch, G., Park, S., Tokei, Z.
Published in 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM) (01.05.2023)

by Veloso, A., Hikavyy, A., Loo, R., Paraschiv, V., Chan, B. T., Radisic, D., Li, W., Versluijs, J. J., Teugels, L., Sebaai, F., Favia, P., Eneman, G., Bender, H., Vancoille, E., Scheerder, J. E., Fleischmann, C., Horiguchi, N., Matagne, P., Huynh-Bao, T., Chasin, A., Simoen, E., Vecchio, E., Devriendt, K., Brus, S., Rosseel, E.
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)

by Gupta, A., Radisic, D., Maes, J. W., Pedreira, O. Varela, Soulie, J-P., Jourdan, N., Mertens, H., Bandyopadhyay, S., Le, Q. T., Pacco, A., Heylen, N., Vandersmissen, K., Devriendt, K., Zhu, C., Datta, S., Sebaai, F., Wang, S., Mousa, M., Lee, J., Geypen, J., De Wachter, B., Chehab, B., Salahuddin, S. M., Murdoch, G., Biesemans, S., Tokei, Zs, Litta, E. Dentoni, Horiguchi, N.
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11.12.2021)

by Veloso, A., Eneman, G., Matagne, P., Vermeersch, B., Jourdain, A., Arimura, H., O'Sullivan, B., Chen, R., De Keersgieter, A., Simoen, E., Radisic, D., Oniki, Y., Laffitte, A., Brus, S., Beyne, E., Litta, E. Dentoni, Horiguchi, N.
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)