Analysis of organic multilayers and 3D structures using Ar cluster ions
Niehuis, E., Möllers, R., Rading, D., Cramer, H.-G., Kersting, R.
Published in Surface and interface analysis (01.01.2013)
Published in Surface and interface analysis (01.01.2013)
Get full text
Journal Article
Conference Proceeding
Surface spectrometry using large argon clusters
Kayser, S., Rading, D., Moellers, R., Kollmer, F., Niehuis, E.
Published in Surface and interface analysis (01.01.2013)
Published in Surface and interface analysis (01.01.2013)
Get full text
Journal Article
Conference Proceeding
Depth profiling of organic materials using improved ion beam conditions
Cramer, H.-G., Grehl, T., Kollmer, F., Moellers, R., Niehuis, E., Rading, D.
Published in Applied surface science (15.12.2008)
Published in Applied surface science (15.12.2008)
Get full text
Journal Article
Dual beam depth profiling of organic materials: Variations of analysis and sputter beam conditions
Rading, D., Moellers, R., Kollmer, F., Paul, W., Niehuis, E.
Published in Surface and interface analysis (01.01.2011)
Published in Surface and interface analysis (01.01.2011)
Get full text
Journal Article
Conference Proceeding
Dual beam depth profiling of polymer materials: comparison of C60 and Ar cluster ion beams for sputtering
Rading, D., Moellers, R., Cramer, H.-G., Niehuis, E.
Published in Surface and interface analysis (01.01.2013)
Published in Surface and interface analysis (01.01.2013)
Get full text
Journal Article
Conference Proceeding
MCs+ depth profiling using cluster primary ions
Niehuis, E., Grehl, T., Kollmer, F., Moellers, R., Rading, D., Kersting, R., Hagenhoff, B.
Published in Surface and interface analysis (01.01.2011)
Published in Surface and interface analysis (01.01.2011)
Get full text
Journal Article
Conference Proceeding
Novel Cluster Ion Beams For Secondary Ion Generation, Sputtering And FIB/SIMS Application
Kollmer, F., Rading, D., Moellers, R., Cramer, H., Paul, W., Niehuis, E.
Published in Microscopy and microanalysis (01.07.2012)
Published in Microscopy and microanalysis (01.07.2012)
Get full text
Journal Article
Antioxidant segregation and crystallisation at polyester surfaces studied by ToF-SIMS
Médard, N., Benninghoven, A., Rading, D., Licciardello, A., Auditore, A., Duc, Tran Minh, Montigaud, H., Vernerey, F., Poleunis, C., Bertrand, P.
Published in Applied surface science (15.01.2003)
Published in Applied surface science (15.01.2003)
Get full text
Journal Article
Depth profiling of ion-implanted AlInN using time-of-flight secondary ion mass spectrometry and cathodoluminescence
Martin, R. W., Rading, D., Kersting, R., Tallarek, E., Nogales, E., Amabile, D., Wang, K., Katchkanov, V., Trager-Cowan, C., O'Donnell, K. P., Watson, I. M., Matias, V., Vantomme, A., Lorenz, K., Alves, E.
Published in Physica status solidi. C (01.06.2006)
Published in Physica status solidi. C (01.06.2006)
Get full text
Journal Article
Dual beam depth profiling of polymer materials: comparison of C 60 and Ar cluster ion beams for sputtering
Rading, D., Moellers, R., Cramer, H.‐G., Niehuis, E.
Published in Surface and interface analysis (01.01.2013)
Published in Surface and interface analysis (01.01.2013)
Get full text
Journal Article
Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study
Shard, Alexander G, Havelund, Rasmus, Spencer, Steve J, Gilmore, Ian S, Alexander, Morgan R, Angerer, Tina B, Aoyagi, Satoka, Barnes, Jean-Paul, Benayad, Anass, Bernasik, Andrzej, Ceccone, Giacomo, Counsell, Jonathan D. P, Deeks, Christopher, Fletcher, John S, Graham, Daniel J, Heuser, Christian, Lee, Tae Geol, Marie, Camille, Marzec, Mateusz M, Mishra, Gautam, Rading, Derk, Renault, Olivier, Scurr, David J, Shon, Hyun Kyong, Spampinato, Valentina, Tian, Hua, Wang, Fuyi, Winograd, Nicholas, Wu, Kui, Wucher, Andreas, Zhou, Yufan, Zhu, Zihua
Published in The journal of physical chemistry. B (20.08.2015)
Published in The journal of physical chemistry. B (20.08.2015)
Get full text
Journal Article
Formation of very large gold superclusters (clusters of clusters) as secondary ions up to (Au13)55 by SIMS
Feld, H, Leute, A, Rading, D, Benninghoven, A, Schmid, G
Published in Journal of the American Chemical Society (01.10.1990)
Published in Journal of the American Chemical Society (01.10.1990)
Get full text
Journal Article
SIMS Imaging and 3D Microanalysis of Organic Structures
Havercroft, N, Rading, D, Kollmer, F, Niehuis, E
Published in Microscopy and microanalysis (01.07.2010)
Published in Microscopy and microanalysis (01.07.2010)
Get full text
Journal Article
Antioxidant segregation and crystallisation at polyester surfaces studied by ToF-SIMS
MEDARD, N, BENNINGHOVEN, A, RADING, D, LICCIARDELLO, A, AUDITORE, A, TRAN MINH DUC, MONTIGAUD, H, VERNEREY, F, POLEUNIS, C, BERTRAND, P
Published in Applied surface science (2003)
Get full text
Published in Applied surface science (2003)
Conference Proceeding
Secondary ion emission from perfluorinated polyethers using megaelectronvolt and kiloelectronvolt ion bombardment
Feld, Herbert, Leute, Angelika, Rading, Derk, Benninghoven, Alfred, Chiarelli, M. Paul, Hercules, David M
Published in Analytical chemistry (Washington) (01.08.1993)
Published in Analytical chemistry (Washington) (01.08.1993)
Get full text
Journal Article
High Mass Resolution Plasma Desorption and Secondary Ion Mass Spectrometry of Neutral Nickel Thiolate Complexes. Crystal Structure of [Ni6(SC3H7)12]
Feld, Herbert, Leute, Angelika, Rading, Derk, Benninghoven, Alfred, Henkel, G., Krüger, Thomas, Krebs, Bernt
Published in Zeitschrift für Naturforschung. B, A journal of chemical sciences (01.07.1992)
Published in Zeitschrift für Naturforschung. B, A journal of chemical sciences (01.07.1992)
Get full text
Journal Article