by Giles, M. D., Arkali Radhakrishna, N., Becher, D., Kornfeld, A., Maurice, K., Mudanai, S., Natarajan, S., Newman, P., Packan, P., Rakshit, T.
Published in 2015 Symposium on VLSI Technology (VLSI Technology) (01.06.2015)

by Kobrinsky, M., Silva, J. D, Mannebach, E., Mills, S., Qader, M. Abd El, Adebayo, O., Radhakrishna, N. Arkali, Beasley, M., Chawla, J., Chugh, S., Dasgupta, A., Desai, U., Re, E. De, Dewey, G., Edwards, T., Engel, C., Gudmundsson, V., Hicks, J., Krist, B., Mehandru, R., Meric, I., Morrow, P., Nandi, D., Patel, P., Ramamurthy, R., Samanta, D., Shoer, L., Amour, A. St, Tan, L. H., Yemenicioglu, S., Wang, X., Ghani, T.
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)

by Kobrinsky, M., Silva, J. D, Mannebach, E., Mills, S., El Qader, M. Abd, Adebayo, O., Radhakrishna, N. Arkali, Beasley, M., Chawla, J., Chugh, S., Clinton, E., Dasgupta, A., Desai, U., De Re, E., Dewey, G., Edwards, T., Engel, C., Galatage, R., Ghani, T., Gudmundsson, V., Hibbeler, L., Hicks, J., Krist, B., Mehandru, R., Meric, I., Morrow, P., Nandi, D., Pantuso, D., Patel, P., Pawashe, C., Radosavljevic, M., Ramamurthy, R., Samanta, D., Cekli, S., Shoer, L., Amour, A. St, Tan, L. H., Yemenicioglu, S., Wang, X., Wiedemer, J. A.
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)