by POEHL FRANK, RZEHA JAN, BECK MATTHIAS, GOESSEL MICHAEL, MUHMENTHALER PETER
Year of Publication 11.05.2010

by Poehl, Frank, Rzeha, Jan, Beck, Matthias, Goessel, Michael, Muhmenthaler, Peter
Year of Publication 11.05.2010

by Poehl, Frank, Rzeha, Jan, Beck, Matthias, Goessel, Michael, Muhmenthaler, Peter
Year of Publication 11.11.2008

by POEHL FRANK, RZEHA JAN, BECK MATTHIAS, GOESSEL MICHAEL, MUHMENTHALER PETER
Year of Publication 11.11.2008

by POEHL FRANK, RZEHA JAN, BECK MATTHIAS, GOESSEL MICHAEL, MUHMENTHALER PETER
Year of Publication 02.10.2008

by POEHL FRANK, RZEHA JAN, BECK MATTHIAS, GOESSEL MICHAEL, MUHMENTHALER PETER
Year of Publication 21.12.2006

by Poehl, F., Rzeha, J., Beck, M., Goessel, M., Arnold, R., Ossimitz, P.
Published in Eleventh IEEE European Test Symposium (ETS'06) (2006)

by BECK, MATTHIAS, GOESSEL MICHAEL DR, MUHMENTHALER, PETER, POEHL, FRANK DR, RZEHA, JAN
Year of Publication 20.12.2006

by BECK, MATTHIAS, MUHMENTHALER, PETER, POEHL, FRANK DR, GOESSEL, MICHAEL DR, RZEHA, JAN
Year of Publication 09.06.2010

by BECK, MATTHIAS, MUHMENTHALER, PETER, POEHL, FRANK DR, GOESSEL, MICHAEL DR, RZEHA, JAN
Year of Publication 09.07.2008

by BECK, MATTHIAS, GOESSEL MICHAEL DR, MUHMENTHALER, PETER, POEHL, FRANK DR, RZEHA, JAN
Year of Publication 21.05.2008