Gate-all-around Twin Silicon nanowire SONOS Memory
Suk, Sung Dae, Yeo, Kyoung Hwan, Cho, Keun Hwi, Li, Ming, Yeoh, Yun young, Hong, Ki-Ha, Kim, Sung-Han, Koh, Young-Ho, Jung, Sunggon, Jang, WonJun, Kim, Dong-Won, Park, Donggun, Ryu, Byung-Il
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
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Conference Proceeding
Laser-induced Epitaxial Growth (LEG) Technology for High Density 3-D Stacked Memory with High Productivity
Yong-Hoon Son, Jong-Wook Lee, Pilkyu Kang, Min-Gu Kang, Jin Bum Kim, Seung Hoon Lee, Young-Pil Kim, In Soo Jung, Byeong Chan Lee, Si Young Choi, U-In Chung, Joo Tea Moon, Byung-Il Ryu
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
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Conference Proceeding
Floating Body DRAM Characteristics of Silicon-On-ONO (SOONO) Devices for System-on-Chip (SoC) Applications
Chang Woo Oh, Na Young Kim, Ho Ju Song, Sung In Hong, Sung Hwan Kim, Yong Lack Choi, Hyun Jun Bae, Dong Uk Choi, Yong Seok Lee, Dong-Won Kim, Donggun Park, Byung-Il Ryu
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
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Conference Proceeding
Innovative Al Damascene Process for Nanoscale Interconnects
Choi, Kyung-In, Han, Sung-Ho, Yun, Sera, Kim, Dae-Yong, Hong, Jong Won, Lee, Sang Woo, Kim, Byung Hee, Kim, Sung-Tae, Chung, U-In, Moon, Joo-Tae, Ryu, Byung-Il
Published in Japanese Journal of Applied Physics (01.04.2006)
Published in Japanese Journal of Applied Physics (01.04.2006)
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Journal Article
Investigation of Chemical Vapor Deposition (CVD)-Derived Cobalt Silicidation for the Improvement of Contact Resistance
Kim, Hyun-Su, Yun, Jong-Ho, Moon, Kwang-Jin, Sohn, Woong-Hee, Jung, Sug-Woo, Jung, Eun-Ji, Kim, Se-Hoon, Bae, Nam-Jin, Choi, Gil-Heyun, Kim, Sung-Tae, Chung, U-In, Moon, Joo-Tae, Ryu, Byung-Il
Published in Japanese Journal of Applied Physics (01.06.2005)
Published in Japanese Journal of Applied Physics (01.06.2005)
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Journal Article
Improved Cell Performance for sub-50 nm DRAM with Manufacturable Bulk FinFET Structure
Deok-Hyung Lee, Sun-Ghil Lee, Jong Ryeol Yoo, Gyoung-Ho Buh, Guk Hyon Yon, Dong-Woon Shin, Dong Kyu Lee, Hyun-Sook Byun, In Soo Jung, Tai-su Park, Yu Gyun Shin, Siyoung Choi, U-In Chung, Joo-Tae Moon, Byung-Il Ryu
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
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Conference Proceeding
A Novel DRAM Cell Transistor Featuring a Partially-insulated Bulk FinFET (Pi-FinFET) with a pad-Polysilicon Side Contacts (PSC)
Han, S.Y., Park, J.M., Sohn, S.O., Lee, J.B., Chae, K.S., Jeon, C.H., Park, J.S., Kim, S.D., Kim, W.J., Yamada, S., Kim, Y.P., Park, H.S., Cho, N.M., Kim, H.H., Lee, M.S., Lee, Y.S., Yang, W., Donggun Park, Byung-il Ryu
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
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Conference Proceeding
Drain leakage fluctuation reduction in the recessed channel array transistor DRAM with the elevated source-drain
Wookje Kim, Satoru Yamada, Sang-Yeon Han, Chang-Hoon Jeon, Shin-Deuk Kim, Siok Soh, Nak-Jin Son, Jung-Su Park, Wouns Yang, Young-Pil Kim, Won-Seok Lee, Donggun Park, Byung-il Ryu
Published in 2006 European Solid-State Device Research Conference (01.09.2006)
Published in 2006 European Solid-State Device Research Conference (01.09.2006)
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Conference Proceeding
Low Voltage Program/Erase Characteristics of Si Nanocrystal Memory with Damascene Gate FinFET on Bulk Si Wafer
Choe, Jeong-Dong, Yeo, Kyoung-Hwan, Ahn, Young-Joon, Lee, Jong-Jin, Lee, Se-Hoon, Choi, Byung-Yong, Sung, Suk-Kang, Cho, Eun-Suk, Lee, Choong-Ho, Kim, Dong-Won, Chung, Il-Sub, Park, Dong-Gun, Ryu, Byung-Il
Published in Journal of semiconductor technology and science (2006)
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Published in Journal of semiconductor technology and science (2006)
Journal Article
Stack DRAM Technologies for the Future
Donggun Park, Wonshick Lee, Byung-il Ryu
Published in 2006 International Symposium on VLSI Technology, Systems, and Applications (01.04.2006)
Published in 2006 International Symposium on VLSI Technology, Systems, and Applications (01.04.2006)
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Conference Proceeding
Investigation of Ni/Co bilayer salicidation process for sub-40nm gate technology
Jung, Eun Ji, Jung, Sug-Woo, Kim, Hyun-Su, Yun, Jong-Ho, Cheong, Seong Hwee, Kim, Byung Hee, Choi, Gil Heyun, Kim, Sung Tae, Chung, U-In, Moon, Joo Tae, Ryu, Byung Il
Published in Microelectronic engineering (01.12.2005)
Published in Microelectronic engineering (01.12.2005)
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Journal Article
Gate-All-Around (GAA) Twin Silicon Nanowire MOSFET (TSNWFET) with 15 nm Length Gate and 4 nm Radius Nanowires
Kyoung Hwan Yeo, Sung Dae Suk, Ming Li, Yun-young Yeoh, Keun Hwi Cho, Ki-Ha Hong, SeongKyu Yun, Mong Sup Lee, Nammyun Cho, Kwanheum Lee, Duhyun Hwang, Bokkyoung Park, Dong-Won Kim, Donggun Park, Byung-Il Ryu
Published in 2006 International Electron Devices Meeting (01.12.2006)
Published in 2006 International Electron Devices Meeting (01.12.2006)
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Conference Proceeding
Sub-25nm single-metal gate CMOS multi-bridge-channel MOSFET (MBCFET) for high performance and low power application
Sung-Young Lee, Eun-Jung Yoon, Dong-Suk Shin, Sung-Min Kim, Sung-Dae Suk, Min-Sang Kim, Dong-Won Kim, Donggun Park, Kinam Kim, Byung-il Ryu
Published in Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005 (2005)
Published in Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005 (2005)
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Conference Proceeding
High performance 5nm radius Twin Silicon Nanowire MOSFET (TSNWFET) : fabrication on bulk si wafer, characteristics, and reliability
Sung Dae Suk, Sung-Young Lee, Sung-Min Kim, Eun-Jung Yoon, Min-Sang Kim, Ming Li, Chang Woo Oh, Kyoung Hwan Yeo, Sung Hwan Kim, Dong-Suk Shin, Kwan-Heum Lee, Heung Sik Park, Jeorig Nam Han, Park, C.J., Jong-Bong Park, Dong-Won Kim, Donggun Park, Byung-Il Ryu
Published in IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest (2005)
Published in IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest (2005)
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Improvement of Performance and Data Retention Characteristics of Sub-50nm DRAM by HfSiON Gate Dielectric
Sangjin Hyun, Hye-Min Kim, Hye-Lan Lee, Kab-Jin Nam, Sug-Hun Hong, Dong-Chan Kim, Jihyun Kim, Soo-Ik Jang, In Sang Jeon, Sangbom Kang, Siyoung Choi, U-In Chung, Joo-Tae Moon, Byung-Il Ryu
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
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Conference Proceeding
Hf-silicate inter-poly dielectric technology for sub 70nm body tied FinFET flash memory
Eun Suk Cho, Choong-Ho Lee, Tae-Yong Kim, Suk-Kang Sung, Byung Kyu Cho, Chul Lee, Hye Jin Cho, Yonghan Roh, Donggun Park, Kinam Kim, Byung-Il Ryu
Published in Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005 (2005)
Published in Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005 (2005)
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Conference Proceeding
Hot carrier generation and reliability of BT(body-tied)-Fin type SRAM cell transistors (W/sub fin/=20/spl sim/70 nm)
Young Joon Ahn, Hye Jin Cho, Hee Soo Kang, Choong-Ho Lee, Chul Lee, Jae-man Yoon, Tae Yong Kim, Eun Suk Cho, Suk-Kang Sung, Donggun Park, Kinam Kim, Byung-Il Ryu
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
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Conference Proceeding
Lateral integration of partially insulated and bulk MOSFETs using partial SOI process
Sung Hwan Kim, Chang Woo Oh, Kyoung Hwan Yeo, Dong Uk Choi, Min Sang Kim, Sung Min Kim, Jeong Dong Choe, Jeongnam Han, Young-Pil Kim, Dong-Won Kim, Donggun Park, Byung-Il Ryu
Published in 2005 IEEE International SOI Conference Proceedings (2005)
Published in 2005 IEEE International SOI Conference Proceedings (2005)
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Conference Proceeding