by ROSSI, Daniele
Year of Publication 08.11.2017

by Rossi-Doria, Daniele
Published in Contemporary Levant (02.01.2016)

by ROSSI, Daniele
Year of Publication 22.06.2017

by ROSSI, DANIELE
Year of Publication 22.06.2017

by ROSSI, DANIELE
Year of Publication 18.06.2017

by Metra, Cecilia, Rossi, Daniele, Mak, T.m.
Published in IEEE transactions on computers (01.03.2007)

by Najdi, Abdessamad, Rossi, Daniele, Tenentes, Vasileios
Published in 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) (01.07.2019)

by Rossi, D., Nieuwland, A.K., van Dijk, S.V.E., Kleihorst, R.P., Metra, C.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.05.2008)

by Rossi, Daniele, Omaña, Martin, Metra, Cecilia
Published in Journal of electronic testing (01.06.2008)

by Martinez, Antonio Leonel Hernandez, Khursheed, Saqib, Rossi, Daniele
Published in 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) (01.07.2020)

by Bergh, Sylvia I., Rossi-Doria, Daniele
Published in Mediterranean politics (Frank Cass & Co.) (04.05.2015)

by Rossi, Daniele, Tenentes, Vasileios, Khursheed, Saqib, Reddy, Sudhakar M.
Published in 2018 IEEE 23rd European Test Symposium (ETS) (01.05.2018)

by ROSSI, DANIELE
Year of Publication 18.02.2015

by DANIELE ROSSI
Year of Publication 14.01.2015

by Omana, M., Rossi, D., Metra, C.
Published in 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (01.10.2009)

by Rossi, D., Omana, M., Toma, F., Metra, C.
Published in 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) (2005)

by Rossi, Daniele Misturini, Flores, Simone Hickmann, Heck, Julio Xandro, Ayub, Marco Ant onio Zachia
Published in Food biotechnology (01.07.2009)

by Tenentes, Vasileios, Rossi, Daniele, Al-Hashimi, Bashir M.
Published in 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS) (01.07.2018)

by Capucci, Cecilia, Rossi, Daniele
Year of Publication 15.12.2022

by Bucciarelli, Andrea, Rossi, Daniele, Auf der Maur, Matthias, Di Carlo, Aldo
Published in 2020 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD) (01.09.2020)