Leakage current modeling of test structures for characterization of dark current in CMOS image sensors
Loukianova, N.V., Folkerts, H.O., Maas, J.P.V., Verbugt, D.W.E., Mierop, A.J., Hoekstra, W., Roks, E., Theuwissen, A.J.P.
Published in IEEE transactions on electron devices (01.01.2003)
Published in IEEE transactions on electron devices (01.01.2003)
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Journal Article
An mK×nK bouwblok CCD image sensor family. II. Characterization
Kreider, G., Dillen, B.G.M., Heijns, H., Korthout, L., Roks, E.
Published in IEEE transactions on electron devices (01.03.2002)
Published in IEEE transactions on electron devices (01.03.2002)
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Journal Article
A twin-channel (p and n) FT-CCD imager with cross-antiblooming
Roks, E., Esser, L.J.M., Narayan, S., Huinink, W.F.
Published in IEEE transactions on electron devices (01.02.1996)
Published in IEEE transactions on electron devices (01.02.1996)
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Journal Article
An S-VHS compatible 1/3" color FT-CCD imager with low dark current by surface pinning
Bosiers, J.T., Roks, E., Peek, H.L., Kleimann, A.C., Van der Sijde, A.G.
Published in IEEE transactions on electron devices (01.08.1995)
Published in IEEE transactions on electron devices (01.08.1995)
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Journal Article
An mK/spl times/nK bouwblok CCD image sensor family. II. Characterization
Kreider, G., Dillen, B.G.M., Heijns, H., Korthout, L., Roks, E.
Published in IEEE transactions on electron devices (01.03.2002)
Published in IEEE transactions on electron devices (01.03.2002)
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Journal Article
An mKnK bouwblok CCD image sensor family. II. Characterization
Kreider, G, Dillen, BGM, Heijns, H, Korthout, L, Roks, E
Published in IEEE transactions on electron devices (01.01.2002)
Published in IEEE transactions on electron devices (01.01.2002)
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Journal Article
An mKx nK bouwblok CCD image sensor family. II.Characterization
Kreider, G, Dillen, B G M, Heijns, H, Korthout, L, Roks, E
Published in IEEE transactions on electron devices (01.03.2002)
Published in IEEE transactions on electron devices (01.03.2002)
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Journal Article
A 2/3" 2-M pixel progressive scan FT-CCD for digital still camera applications
Bosiers, J.T., Kleimann, A.C., van der Sijde, A., Korthout, L., Verbugt, D.W., Peek, H.L., Roks, E., Heringa, A., Vledder, F.F., Opmeer, P.
Published in International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) (1998)
Published in International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) (1998)
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Conference Proceeding
An mK x nK bouwblok CCD image sensor family - Part II: Characterization
Kreider, Greg, Dillen, Bart G M, Heijns, Henk, Korthout, Laurens, Roks, Edwin
Published in IEEE transactions on electron devices (01.03.2002)
Published in IEEE transactions on electron devices (01.03.2002)
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Journal Article
The hole role
Theuwissen, A.J.P., Bosiers, J.T., Roks, E.
Published in IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest (2005)
Published in IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest (2005)
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Conference Proceeding
Twin-Channel (P and N) CCD Image Sensor with Cross Anti-Blooming
Roks, Edwin, Esser, Leonard J. M., Sankaranarayanan, L., Huinink, Wim F.
Published in ESSDERC '93: 23rd European solid State Device Research Conference (01.09.1993)
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Published in ESSDERC '93: 23rd European solid State Device Research Conference (01.09.1993)
Conference Proceeding
A bipolar floating base detector (FBD) for CCD image sensors
Roks, Centen, Sankaranarayanan, Slotboom, Bosiers, Huinink
Published in 1992 International Technical Digest on Electron Devices Meeting (1992)
Published in 1992 International Technical Digest on Electron Devices Meeting (1992)
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Conference Proceeding
A S-VHS compatible 1/3" 720(H)588(V) FT-CCD with low dark current by surface pinning
Bosiers, Peek, Kleimann, Daemen, Roks, van der Sijde, Jansen, Opmeer
Published in 1992 International Technical Digest on Electron Devices Meeting (1992)
Published in 1992 International Technical Digest on Electron Devices Meeting (1992)
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Conference Proceeding