Spin-dependent electron scattering in cobalt interconnects
Lanzillo, Nicholas A, Bhosale, Prasad, Lavoie, Christian, Dechene, Daniel J, Robison, Robert R, Choi, Kisik
Published in Journal of physics. D, Applied physics (04.12.2019)
Published in Journal of physics. D, Applied physics (04.12.2019)
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Journal Article
Design of projected phase-change memory mushroom cells for low-resistance drift
Philip, Timothy M., Brew, Kevin W., Li, Ning, Simon, Andrew, Liu, Zuoguang, Ok, Injo, Adusumilli, Praneet, Saraf, Iqbal, Conti, Richard, Ogundipe, Odunayo, Robison, Robert R., Saulnier, Nicole, Sebastian, Abu, Narayanan, Vijay
Published in MRS bulletin (01.03.2023)
Published in MRS bulletin (01.03.2023)
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Journal Article
Hybrid methodology to model random dopant fluctuations in low doped FinFETs
Agarwal, Samarth, Johnson, Jeffrey B., Bajaj, Mohit, Furkay, Stephen S., Oldiges, Philip J., Robison, Robert R., Murali, K. V. R. M.
Published in Journal of computational electronics (01.06.2015)
Published in Journal of computational electronics (01.06.2015)
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Journal Article
Impact of Lateral Asymmetric Channel Doping on 45-nm-Technology N-Type SOI MOSFETs
Nayfeh, H.M., Rovedo, N., Bryant, A., Narasimha, S., Kumar, A., Xiaojun Yu, Ning Su, Kumar, A., Sleight, J.W., Robison, R.R., Rausch, W., Mallela, H., Freeman, G.
Published in IEEE transactions on electron devices (01.12.2009)
Published in IEEE transactions on electron devices (01.12.2009)
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Journal Article
A Materials Screening Methodology for Scaled Non-Volatile Memory in the AI Era
Lanzillo, Nicholas A., Robison, Robert R.
Published in 2019 IEEE Albany Nanotechnology Symposium (ANS) (01.11.2019)
Published in 2019 IEEE Albany Nanotechnology Symposium (ANS) (01.11.2019)
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Conference Proceeding
Grain boundary scattering in Ru and Cu interconnects
Markussen, Troels, Aboud, Shela, Blom, Anders, Lanzillo, Nicholas A., Gunst, Tue, Cobb, Jonathan, Philip, Tim M., Robison, Robert R.
Published in 2020 IEEE International Interconnect Technology Conference (IITC) (05.10.2020)
Published in 2020 IEEE International Interconnect Technology Conference (IITC) (05.10.2020)
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Conference Proceeding
Gate-Cut-Last in RMG to Enable Gate Extension Scaling and Parasitic Capacitance Reduction
Greene, Andrew, Zhou, Huimei, Xie, Ruilong, Park, Chanro, Economikos, Laertis, Chan, Victor, Akarvardar, Kerem, Bao, Ruqiang, Seshadri, Indira, Conti, Richard, Wang, Miaomiao, Sankarapandian, Muthumanickam, Demarest, James, Li, Juntao, Jiang, Liying, Zhao, Kai, Robison, Robert, Ando, Takashi, Cave, Nigel, Knorr, Andreas, Gupta, Dinesh, Kanakasabapathy, Sivananda, Guo, Dechao, Haran, Bala, Basker, Veeraraghavan, Bu, Huiming
Published in 2019 Symposium on VLSI Technology (01.06.2019)
Published in 2019 Symposium on VLSI Technology (01.06.2019)
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Conference Proceeding
Leakage Engineering Enabling PDSOI Ring Oscillators Operating in Sub-100pA/µm I off Regime
Ren, Zhibin, Cai, Jin, Robison, Robert R., Jagannathan, Basanth, Park, Dae-Gyu, Ning, Tak H.
Published in ECS transactions (21.03.2011)
Published in ECS transactions (21.03.2011)
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Journal Article
Gate-all-around field effect transistor having multiple threshold voltages
Robison, Robert R, Vega, Reinaldo, Guillorn, Michael A, Hook, Terence, Bao, Ruqiang, Yamashita, Tenko
Year of Publication 18.06.2024
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Year of Publication 18.06.2024
Patent
First principles evaluation of fcc ruthenium for use in advanced interconnects
Philip, Timothy M, Lanzillo, Nicholas A, Gunst, Tue, Markussen, Troels, Cobb, Jonathan, Aboud, Shela, Robison, Robert R
Published in arXiv.org (04.03.2020)
Published in arXiv.org (04.03.2020)
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Paper
Journal Article
NANOSHEET FIELD EFFECT TRANSISTORS WITH PARTIAL INSIDE SPACERS
Robison, Robert R, Vega, Reinaldo A, Hook, Terence B, Guillorn, Michael A, Venigalla, Rajasekhar
Year of Publication 06.10.2022
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Year of Publication 06.10.2022
Patent
Nanosheet field effect transistors with partial inside spacers
Robison, Robert R, Vega, Reinaldo A, Hook, Terence B, Guillorn, Michael A, Venigalla, Rajasekhar
Year of Publication 24.05.2022
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Year of Publication 24.05.2022
Patent
Gate-all-around field effect transistor having multiple threshold voltages
Robison, Robert R, Vega, Reinaldo, Guillorn, Michael A, Hook, Terence, Bao, Ruqiang, Yamashita, Tenko
Year of Publication 08.02.2022
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Year of Publication 08.02.2022
Patent