Minority carrier lifetime in indium doped silicon for photovoltaics
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Published in Progress in photovoltaics (01.10.2019)
Published in Progress in photovoltaics (01.10.2019)
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The role of prismatic dislocation loops in the generation of glide dislocations in Cz-silicon
Giannattasio, Armando, Senkader, Semih, Falster, Robert J., Wilshaw, Peter R.
Published in Computational materials science (01.05.2004)
Published in Computational materials science (01.05.2004)
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Conference Proceeding
HIGH RESISTIVITY SINGLE CRYSTAL SILICON INGOT AND WAFER HAVING IMPROVED MECHANICAL STRENGTH
IGOR PEIDOUS, CARISSIMA MARIE HUDSON, SOUBIR BASAK, KIM BYUNGCHUN, LEE HYUNGMIN, ROBERT J FALSTER
Year of Publication 28.10.2021
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Year of Publication 28.10.2021
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APPARATUS FOR STRESSING SEMICONDUCTOR SUBSTRATES
VLADIMIR V VORONKOV, JOHN A PITNEY, ROBERT J FALSTER, ALBRECHT PETER D
Year of Publication 01.04.2021
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Year of Publication 01.04.2021
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APPARATUS FOR STRESSING SEMICONDUCTOR SUBSTRATES
VLADIMIR V VORONKOV, JOHN A PITNEY, ROBERT J FALSTER, ALBRECHT PETER D
Year of Publication 18.03.2021
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Year of Publication 18.03.2021
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EQUIPMENT FOR APPLYING STRESS TO SEMICONDUCTOR SUBSTRATE
VLADIMIR V VORONKOV, JOHN A PITNEY, ROBERT J FALSTER, ALBRECHT PETER D
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Year of Publication 26.09.2019
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PROCESS AND APPARATUS FOR PREPARING STRAIN-REDUCED HETERO-STRUCTURE BY EXPANSION IN RADIAL DIRECTION
VLADIMIR V VORONKOV, JOHN A PITNEY, ROBERT J FALSTER, ALBRECHT PETER D
Year of Publication 16.08.2018
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Year of Publication 16.08.2018
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DEVICE FOR APPLYING STRESS TO SEMICONDUCTOR SUBSTRATE
VLADIMIR V VORONKOV, JOHN A PITNEY, ROBERT J FALSTER, ALBRECHT PETER D
Year of Publication 26.07.2018
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Year of Publication 26.07.2018
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(Invited) Boron-Oxygen Related Lifetime Degradation in p-type and n-type Silicon
Voronkov, Vladimir V, Falster, Robert J, Lim, Bianca, Schmidt, Jan
Published in ECS transactions (15.03.2013)
Published in ECS transactions (15.03.2013)
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(Invited) The Impact of Oxide Precipitates on Minority Carrier Lifetime in Czochralski Silicon
Murphy, John D, Bothe, Karsten, Krain, Rafael, Voronkov, Vladimir V, Falster, Robert J
Published in ECS transactions (15.03.2013)
Published in ECS transactions (15.03.2013)
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(Invited) Lifetime Degradation in Boron Doped Czochralski Silicon
Voronkov, Vladimir V., Falster, Robert J., Schmidt, Jan, Bothe, Karsten, Batunina, Anna
Published in ECS transactions (01.10.2010)
Published in ECS transactions (01.10.2010)
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Journal Article
Minority Carrier Lifetime in Czochralski Silicon Containing Oxide Precipitates
Murphy, John D., Bothe, Karsten, Olmo, Massimiliano, Voronkov, Vladimir V., Falster, Robert J.
Published in ECS transactions (01.10.2010)
Published in ECS transactions (01.10.2010)
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APPARATUS FOR PREPARING HETEROSTRUCTURES WITH REDUCED STRAIN BY RADIAL COMPRESSION
FALSTER, Robert J, VORONKOV, Vladimir V, PITNEY, John A, ALBRECHT, Peter D
Year of Publication 16.10.2024
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Year of Publication 16.10.2024
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Apparatus for stressing semiconductor substrates
Albrecht, Peter D, Pitney, John A, Voronkov, Vladimir V, Falster, Robert J
Year of Publication 19.09.2023
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Year of Publication 19.09.2023
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APPARATUS FOR PREPARING HETEROSTRUCTURES WITH REDUCED STRAIN BY RADIAL COMPRESSION
FALSTER, Robert J, VORONKOV, Vladimir V, PITNEY, John A, ALBRECHT, Peter D
Year of Publication 25.05.2022
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Year of Publication 25.05.2022
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SILICON WAFERS WITH INTRINSIC GETTERING AND GATE OXIDE INTEGRITY YIELD
RYU, Jae-Woo, KIM, Tae Hoon, JI, Jun Hwan, LEE, Young Jung, FALSTER, Robert J, KIM, Byung Chun, HUDSON, Carissima Marie, PARK, Soon Sung
Year of Publication 28.02.2024
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Year of Publication 28.02.2024
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