Optical monitoring of capacitance in hemispherical grain polycrystalline silicon for advanced dynamic random access memory application
LEE, S. B, KIM, J. O, RITZ, K. N, OPSAL, J, OH, H.-J, WOO, S.-H, SHIN, S.-W, HAN, I.-K, YANG, H.-S
Published in Journal of the Electrochemical Society (01.11.1998)
Published in Journal of the Electrochemical Society (01.11.1998)
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Polycrystalline silicon emitter contacts formed by rapid thermal annealing
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Published in Journal of the Electrochemical Society (1989)
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The Microstructure of Ball Bond Corrosion Failures
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Published in 25th International Reliability Physics Symposium (01.04.1987)
Published in 25th International Reliability Physics Symposium (01.04.1987)
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