Quantum calculations of the carrier mobility: Methodology, Matthiessen's rule, and comparison with semi-classical approaches
Niquet, Yann-Michel, Nguyen, Viet-Hung, Triozon, François, Duchemin, Ivan, Nier, Olivier, Rideau, Denis
Published in Journal of applied physics (07.02.2014)
Published in Journal of applied physics (07.02.2014)
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Journal Article
Contact resistances in trigate and FinFET devices in a non-equilibrium Green's functions approach
Bourdet, Léo, Li, Jing, Pelloux-Prayer, Johan, Triozon, François, Cassé, Mikaël, Barraud, Sylvain, Martinie, Sébastien, Rideau, Denis, Niquet, Yann-Michel
Published in Journal of applied physics (28.02.2016)
Published in Journal of applied physics (28.02.2016)
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Journal Article
Comprehensive Modeling and Characterization of Photon Detection Efficiency and Jitter Tail in Advanced SPAD Devices
Helleboid, Remi, Rideau, Denis, Grebot, Jeremy, Nicholson, Isobel, Moussy, Norbert, Saxod, Olivier, Basset, Marie, Zimmer, Antonin, Mamdy, Bastien, Golanski, Dominique, Agnew, Megan, Pellegrini, Sara, Sicre, Mathieu, Buj, Christel, Marchand, Guillaume, Saint-Martin, Jerome, Pala, Marco, Dollfus, Philippe
Published in IEEE journal of the Electron Devices Society (2022)
Published in IEEE journal of the Electron Devices Society (2022)
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Journal Article
Fully Atomistic Simulations of Phonon-Limited Mobility of Electrons and Holes in \langle \hbox\rangle-, \langle \hbox\rangle-, and \langle \hbox\rangle -Oriented Si Nanowires
Niquet, Y-M, Delerue, C., Rideau, D., Videau, B.
Published in IEEE transactions on electron devices (01.05.2012)
Published in IEEE transactions on electron devices (01.05.2012)
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Journal Article
An Efficient Nonlocal Hot Electron Model Accounting for Electron-Electron Scattering
Zaka, A., Palestri, P., Rafhay, Q., Clerc, R., Iellina, M., Rideau, D., Tavernier, C., Pananakakis, G., Jaouen, H., Selmi, L.
Published in IEEE transactions on electron devices (01.04.2012)
Published in IEEE transactions on electron devices (01.04.2012)
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Journal Article
A Fokker–Planck-based Monte Carlo method for electronic transport and avalanche simulation in single-photon avalanche diodes
Helleboid, Rémi, Rideau, Denis, Nicholson, Isobel, Grebot, Jeremy, Mamdy, Bastien, Mugny, Gabriel, Basset, Marie, Agnew, Megan, Golanski, Dominique, Pellegrini, Sara, Saint-Martin, Jérôme, Pala, Marco, Dollfus, Philippe
Published in Journal of physics. D, Applied physics (15.12.2022)
Published in Journal of physics. D, Applied physics (15.12.2022)
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Journal Article
On the convergence of the recurrence solution of McIntyre's local and non-local avalanche triggering probability equations for SPAD compact models
Saint-Pierre, Dorian, Clerc, Raphael, Helleboid, Remi, Rideau, Denis
Published in ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) (19.09.2022)
Published in ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) (19.09.2022)
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Conference Proceeding
Modeling of SPAD avalanche breakdown probability and jitter tail with field lines
Helleboid, Rémi, Rideau, Denis, Grebot, Jeremy, Nicholson, Isobel, Moussy, Norbert, Saxod, Olivier, Saint-Martin, Jérôme, Pala, Marco, Dollfus, Philippe
Published in Solid-state electronics (01.08.2022)
Published in Solid-state electronics (01.08.2022)
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Journal Article
Experimental gm/ID Invariance Assessment for Asymmetric Double-Gate FDSOI MOSFET
El Ghouli, Salim, Rideau, Denis, Monsieur, Frederic, Scheer, Patrick, Gouget, Gilles, Juge, André, Poiroux, Thierry, Sallese, Jean-Michel, Lallement, Christophe
Published in IEEE transactions on electron devices (01.01.2018)
Published in IEEE transactions on electron devices (01.01.2018)
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Journal Article
Design of integrated capacitive modulators for 56Gbps operation
Douix, Maurin, Marris-Morini, Delphine, Baudot, Charles, Cremer, Sebastien, Rideau, Denis, Perez-Galacho, Diego, Souhaite, Aurelie, Blanc, Romuald, Batail, Estelle, Vulliet, Nathalie, Vivien, Laurent, Cassan, Eric, Boeuf, Frederic
Published in 2016 IEEE 13th International Conference on Group IV Photonics (GFP) (01.08.2016)
Published in 2016 IEEE 13th International Conference on Group IV Photonics (GFP) (01.08.2016)
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Conference Proceeding
Full-Band Monte Carlo Study of Hot Carriers for Advection-Diffusion Monte Carlo Simulations
Helleboid, Remi, Saint-Martin, Jerome, Pala, Marco, Dollfus, Philippe, Mugny, Gabriel, Nicholson, Isobel, Rideau, Denis
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2023)
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2023)
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Conference Proceeding
Experimental /} Invariance Assessment for Asymmetric Double-Gate FDSOI MOSFET
El Ghouli, Salim, Rideau, Denis, Monsieur, Frederic, Scheer, Patrick, Gouget, Gilles, Juge, Andre, Poiroux, Thierry, Sallese, Jean-Michel, Lallement, Christophe
Published in IEEE transactions on electron devices (01.01.2018)
Published in IEEE transactions on electron devices (01.01.2018)
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Journal Article
Quantum Modeling of the Carrier Mobility in FDSOI Devices
Viet-Hung Nguyen, Niquet, Yann-Michel, Triozon, Francois, Duchemin, Ivan, Nier, Olivier, Rideau, Denis
Published in IEEE transactions on electron devices (01.09.2014)
Published in IEEE transactions on electron devices (01.09.2014)
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Journal Article
Inter-band coupling in Empirical Pseudopotential Method based bandstructure calculations of group IV and III-V nanostructures
Rideau, Denis, Mugny, Gabriel, Pala, Marco, Esseni, David
Published in 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2018)
Published in 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2018)
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Conference Proceeding
Semi-Empirical model for optical properties of \text\text alloys accounting for strain and temperature
Grebot, Jeremy, Mugny, Gabriel, Helleboid, Remi, Nicholson, Isobel, Abbate, Francesco, Rideau, Denis, Wehbe-Alause, Helene, Scheid, Claire, Lanteri, Stephane
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
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Conference Proceeding