On-Line Digital Fine Monitoring of SiC MOSFET Gate-Oxide Health: A Dual-Channel Gate Driving Approach
Picot-Digoix, M., Le, T-L, Azzopardi, S., Vinnac, S., Richardeau, F., Blaquiere, J-M.
Published in 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (02.06.2024)
Published in 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (02.06.2024)
Get full text
Conference Proceeding
SiC MOSFETs soft and hard failure modes: functional analysis and structural characterization
Richardeau, F., Boige, F., Castellazzi, A., Chazal, V., Fayyaz, A., Borghese, A., Irace, Andrea, Guibaud, G.
Published in 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.09.2020)
Published in 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.09.2020)
Get full text
Conference Proceeding
Multicell converters: derived topologies
Meynard, T.A., Foch, H., Forest, F., Turpin, C., Richardeau, F., Delmas, L., Gateau, G., Lefeuvre, E.
Published in IEEE transactions on industrial electronics (1982) (01.10.2002)
Published in IEEE transactions on industrial electronics (1982) (01.10.2002)
Get full text
Journal Article
Use of opposition method in the test of high-power electronic converters
Forest, F., Huselstein, J.-J., Faucher, S., Elghazouani, M., Ladoux, P., Meynard, T.A., Richardeau, F., Turpin, C.
Published in IEEE transactions on industrial electronics (1982) (01.04.2006)
Published in IEEE transactions on industrial electronics (1982) (01.04.2006)
Get full text
Journal Article
Failures-tolerance and remedial strategies of a PWM multicell inverter
Richardeau, F., Baudesson, P., Meynard, T.A.
Published in IEEE transactions on power electronics (01.11.2002)
Published in IEEE transactions on power electronics (01.11.2002)
Get full text
Journal Article
Fault management of multicell converters
Turpin, C., Baudesson, P., Richardeau, F., Forest, F., Meynard, T.A.
Published in IEEE transactions on industrial electronics (1982) (01.10.2002)
Published in IEEE transactions on industrial electronics (1982) (01.10.2002)
Get full text
Journal Article
New Self-Switching Converters
Richardeau, F., Roux, N., Foch, H., Laur, J.-P., Breil-Dupuy, M., Sanchez, J.-L., Capy, F.
Published in IEEE transactions on power electronics (01.03.2008)
Published in IEEE transactions on power electronics (01.03.2008)
Get full text
Journal Article
Using the multilevel imbricated cells topologies in the design of low-power power-factor-corrector converters
Forest, F., Meynard, T.A., Faucher, S., Richardeau, F., Huselstein, J.-J., Joubert, C.
Published in IEEE transactions on industrial electronics (1982) (01.02.2005)
Published in IEEE transactions on industrial electronics (1982) (01.02.2005)
Get full text
Journal Article
Preconditioning of Ohmic p-GaN power HEMT for reproducible V measurements
Ghizzo, L., Trémouilles, D., Richardeau, F., Guibaud, G.
Published in Solid-state electronics (01.01.2024)
Published in Solid-state electronics (01.01.2024)
Get full text
Journal Article
A ZVS imbricated cell multilevel inverter with auxiliary resonant commutated poles
Turpin, C., Deprez, L., Forest, F., Richardeau, F., Meynard, T.A.
Published in IEEE transactions on power electronics (01.11.2002)
Published in IEEE transactions on power electronics (01.11.2002)
Get full text
Journal Article
Reliability Calculation of Multilevel Converters: Theory and Applications
Richardeau, F., Pham, T. T. L.
Published in IEEE transactions on industrial electronics (1982) (01.10.2013)
Published in IEEE transactions on industrial electronics (1982) (01.10.2013)
Get full text
Journal Article
Preconditioning of Ohmic p-GaN power HEMT for reproducible Vth measurements
Ghizzo, L., Trémouilles, D., Richardeau, F., Guibaud, G.
Published in Solid-state electronics (01.04.2024)
Published in Solid-state electronics (01.04.2024)
Get full text
Journal Article
Thermo-mechanical and metallurgical preliminary analysis of SiC MOSFET gate-damage mode under short-circuit based on a complete transient multiphysics 2D FEM
Shqair, M., Sarraute, E., Cazimajou, T., Richardeau, F.
Published in Microelectronics and reliability (01.11.2023)
Published in Microelectronics and reliability (01.11.2023)
Get full text
Journal Article
Preconditioning of p-GaN power HEMT for reproducible Vth measurements
Ghizzo, L., Trémouilles, D., Richardeau, F., Vinnac, S., Moreau, L., Mauran, N.
Published in Microelectronics and reliability (01.05.2023)
Published in Microelectronics and reliability (01.05.2023)
Get full text
Journal Article
Switching faults and safe control of an ARCP multicell flying capacitor inverter
Turpin, C., Forest, F., Richardeau, F., Meynard, T.A., Lacarnoy, A.
Published in IEEE transactions on power electronics (01.09.2003)
Published in IEEE transactions on power electronics (01.09.2003)
Get full text
Journal Article