Search Results - "RICHARD WALLINGFORD" :: K.UTB vyhledávací portál

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The AOA makes a difference in your life and the lives of your patients: Address to the House of Delegates June 25, 2005

by Wallingford, Richard L.
Published in Optometry (Saint Louis, Mo.) (01.09.2005)

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Journal Article

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SYSTEM AND METHOD FOR DETECTING DEFECT ON WAFER

by MAHADEVAN MOHAN, HUANG JUNQING, TAO LUO, GAO LISHENG, JASON KIRKWOOD, JAMES A SMITH, CHEN LU, RICHARD WALLINGFORD
Year of Publication 05.03.2020

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Patent

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METHOD FOR MIXED MODE WAFER INSPECTION

by PARK ALLEN, ELLIS CHANG, BHASKAR CHETANA, LIN JASON, RONG SONGNIAN, RICHARD WALLINGFORD
Year of Publication 14.06.2018

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Patent

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Deep generative model-based alignment for semiconductor applications

by Brauer, Bjorn, Wallingford, Richard
Year of Publication 14.05.2024

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Patent

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SYSTEMS AND METHODS FOR DETECTING DEFECTS ON WAFER

by MAHADEVAN MOHAN, HUANG JUNQING, TAO LUO, GAO LISHENG, JASON KIRKWOOD, JAMES A SMITH, CHEN LU, RICHARD WALLINGFORD
Year of Publication 15.02.2018

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Patent

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DEEP GENERATIVE MODEL-BASED ALIGNMENT FOR SEMICONDUCTOR APPLICATIONS

by Brauer, Bjorn, Wallingford, Richard
Year of Publication 24.11.2022

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Patent

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DEEP GENERATIVE MODEL-BASED ALIGNMENT FOR SEMICONDUCTOR APPLICATIONS

by WALLINGFORD, Richard, BRAUER, Bjorn
Year of Publication 10.11.2022

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Patent

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SEMANTIC IMAGE SEGMENTATION FOR SEMICONDUCTOR-BASED APPLICATIONS

by WALLINGFORD, Richard, BRAUER, Bjorn
Year of Publication 13.10.2022

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Patent

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SEMANTIC IMAGE SEGMENTATION FOR SEMICONDUCTOR-BASED APPLICATIONS

by Brauer, Bjorn, Wallingford, Richard
Year of Publication 06.10.2022

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Patent

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SYSTEMS AND METHODS FOR DETECTING DEFECTS ON WAFER

by MAHADEVAN MOHAN, HUANG JUNQING, TAO LUO, GAO LISHENG, JASON KIRKWOOD, JAMES A SMITH, CHEN LU, RICHARD WALLINGFORD
Year of Publication 15.09.2016

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Patent

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METHOD FOR GENERATING STANDARD REFERENCE DIE FOR USE IN STANDARD REFERENCE DIE COMPARISON INSPECTION AND METHOD FOR INSPECTING WAFER

by SANTOSH BHATTACHARYYA, ARDIS LIANG, BHASKAR KRIS, MARK MCCORD, HUBERT ALTENDORFER, KAIS MAAYAH, RICHARD WALLINGFORD
Year of Publication 23.07.2015

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Patent

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METHOD FOR INSPECTING WAFER

by SANTOSH BHATTACHARYYA, ARDIS LIANG, BHASKAR KRIS, MARK MCCORD, HUBERT ALTENDORFER, KAIS MAAYAH, RICHARD WALLINGFORD
Year of Publication 25.12.2014

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Patent

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SYSTEM AND METHOD FOR DETECTING DEFECT ON WAFER

by MAHADEVAN MOHAN, HUANG JUNQING, TAO LUO, GAO LISHENG, JASON KIRKWOOD, JAMES A SMITH, CHEN LU, RICHARD WALLINGFORD
Year of Publication 21.05.2015

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Patent

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Deep learning based defect detection

by Wallingford, Richard, Park, Sangbong, Cong, Ge
Year of Publication 03.10.2023

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Patent

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DEEP LEARNING BASED DEFECT DETECTION

by WALLINGFORD, Richard, CONG, Ge, PARK, Sangbong
Year of Publication 09.08.2023

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Patent

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MULTIMODE DEFECT DETECTION

by Wallingford, Richard, Park, Sangbong, Cong, Ge, Shifrin, Eugene
Year of Publication 16.05.2024

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Patent

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MULTIMODE DEFECT DETECTION

by WALLINGFORD, Richard, CONG, Ge, PARK, Sangbong, SHIFRIN, Eugene
Year of Publication 16.05.2024

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Patent

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DEEP LEARNING MODEL-BASED ALIGNMENT FOR SEMICONDUCTOR APPLICATIONS

by Li, Xiaochun, Wallingford, Richard, Chen, Hong, Fan, Ziqi, Park, Sangbong
Year of Publication 21.03.2024

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Patent

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Depth generative model-based alignment for semiconductor applications

by WALLINGFORD RICHARD, BRAUER BJORN
Year of Publication 31.10.2023

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Patent

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Semantic image segmentation based on semiconductor applications

by WALLINGFORD RICHARD, BRAUER BJORN
Year of Publication 13.10.2023

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Patent

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