by Ferrer-Quintero, M., Fernández, D., López-Carrilero, R., Birulés, I., Barajas, A., Lorente-Rovira, E., Luengo, A., Díaz-Cutraro, L., Verdaguer, M., García-Mieres, H., Gutiérrez-Zotes, A., Grasa, E., Pousa, E., Huerta-Ramos, E., Pélaez, T., Barrigón, M. L., Gómez-Benito, J., González-Higueras, F., Ruiz-Delgado, I., Cid, J., Moritz, S., Sevilla-Llewellyn-Jones, J., Ochoa, S.
Published in European archives of psychiatry and clinical neuroscience (01.10.2022)

by Piet Engelke, Polian, I., Renovell, M., Becker, B.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.10.2006)

by Engelke, P., Polian, I., Renovell, M., Kundu, S., Seshadri, B., Becker, B.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.02.2008)

by Renovell, M., Zorian, Y.
Published in Proceedings - International Test Conference (2000)

by Balen, T R, Calvano, J V, Lubaszewski, M S, Renovell, M
Published in Journal of electronic testing (01.12.2007)

by Azais, F., Bernard, S., Bertrand, Y., Renovell, M.
Published in Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 (2001)

by Renovell, M., Cambon, G.N.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.11.1992)

by Kerzérho, V, Cauvet, P, Bernard, S, Azaïs, F, Renovell, M, Comte, M, Chakib, O
Published in VLSI Design (01.01.2008)

by Renovell, M., Figueras, J., Zorian, Y.
Published in Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) (1997)

by Azaïs, F, Bernard, S, Bertrand, Y, Renovell, M
Published in Journal of electronic testing (01.04.2001)

by Renovell, M, Gallière, Jm, Azaïs, F, Bertrand, Y
Published in Journal of electronic testing (01.08.2003)

by Renovell, M, Azaïs, F, Bertrand, Y
Published in Journal of electronic testing (1999)

by Tahoori, M.B., McCluskey, E.J., Renovell, M., Faure, P.
Published in 22nd IEEE VLSI Test Symposium, 2004. Proceedings (2004)

by KERZERHO, V, CAUVET, P, BERNARD, S, AZAÏS, F, COMTE, M, RENOVELL, M
Published in IET computers & digital techniques (01.05.2007)

by Renovell, M.
Published in Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) (1998)

by Engelke, P., Polian, I., Renovell, M., Seshadri, B., Becker, B.
Published in 22nd IEEE VLSI Test Symposium, 2004. Proceedings (2004)

by Bouchakour, R., Portal, J.M., Gallière, J.M., Azais, F., Bertrand, Y., Renovell, M.
Published in Microelectronic engineering (01.04.2004)

by Azais, F., Bernard, S., Bertrand, Y., Michel, X., Renovell, M.
Published in Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 (2001)

by Azaïs, F, Bernard, S, Bertrand, Y, Renovell, M
Published in Journal of electronic testing (01.06.2001)

by Bernard, S, Azaïs, F, Bertrand, Y, Renovell, M
Published in Journal of electronic testing (01.08.2003)