Investigation on the Implementation of Stateful Minority Logic for Future In-Memory Computing
Liu, Chunyang, Ren, Pengpeng, Zhou, Bo, Zhang, Jianfu, Fang, Hui, Ji, Zhigang
Published in IEEE access (2021)
Published in IEEE access (2021)
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Journal Article
Investigation of Time Dependent Dielectric Breakdown (TDDB) of Hf0.5Zr0.5O2-Based Ferroelectrics Under Both Forward and Reverse Stress Conditions
Liu, Zhiwei, Cai, Puyang, Yu, Songhai, Han, Linxin, Wang, Runsheng, Wu, Yanqing, Ren, Pengpeng, Ji, Zhigang, Huang, Ru
Published in IEEE journal of the Electron Devices Society (2021)
Published in IEEE journal of the Electron Devices Society (2021)
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Journal Article
Multi-Band Up-Converted Lasing Behavior in NaYF₄:Yb/Er Nanocrystals
Peng, Ya-Pei, Lu, Wei, Ren, Pengpeng, Ni, Yiquan, Wang, Yunfeng, Yan, Peiguang, Zeng, Yu-Jia, Zhang, Wenfei, Ruan, Shuangchen
Published in Nanomaterials (Basel, Switzerland) (05.07.2018)
Published in Nanomaterials (Basel, Switzerland) (05.07.2018)
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Journal Article
Duty cycle shift under static/dynamic aging in 28nm HK-MG technology
Sutaria, Ketul B., Pengpeng Ren, Mohanty, Abinash, Xixiang Feng, Runsheng Wang, Ru Huang, Yu Cao
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
A new efficient method for characterizing time constants of switching oxide traps
Shaofeng Guo, Pengpeng Ren, Runsheng Wang, Zhuoqing Yu, Mulong Luo, Xing Zhang, Ru Huang
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
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Conference Proceeding
A Simple Method for Series Resistance Extraction in Ultrascaled FinFETs Using Flicker Noise
Wu, Junjie, Ren, Pengpeng, Ji, Zhigang
Published in IEEE transactions on electron devices (01.11.2023)
Published in IEEE transactions on electron devices (01.11.2023)
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Journal Article
Deep understanding of AC RTN in MuGFETs through new characterization method and impacts on logic circuits
Jibin Zou, Runsheng Wang, Mulong Luo, Ru Huang, Nuo Xu, Pengpeng Ren, Changze Liu, Weize Xiong, Jianping Wang, Jinhua Liu, Jingang Wu, Waisum Wong, Shaofeng Yu, Hanming Wu, Shiuh-Wuu Lee, Yangyuan Wang
Published in 2013 Symposium on VLSI Technology (01.06.2013)
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Published in 2013 Symposium on VLSI Technology (01.06.2013)
Conference Proceeding
Diagnosing bias runaway in analog/mixed signal circuits
Sutaria, Ketul B., Pengpeng Ren, Ramkumar, Athul, Rongjun Zhu, Xixiang Feng, Runsheng Wang, Ru Huang, Yu Cao
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
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Conference Proceeding
Inhibition of SND1 overcomes chemoresistance in bladder cancer cells by promoting ferroptosis
Zhao, Yu, Ren, Pengpeng, Yang, Zhiqin, Wang, Lei, Hu, Changhua
Published in Oncology reports (01.01.2023)
Published in Oncology reports (01.01.2023)
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Journal Article
Clinical efficacy of internal fixation with locking compression plates in the treatment of patients with extremity fractures and the effect on the recovery of limb function
Wu, Jun, Chen, Yang, Zhu, Yin, Wu, Xiaodong, Ren, Pengpeng, Cao, Feng
Published in Medicine (Baltimore) (01.12.2023)
Published in Medicine (Baltimore) (01.12.2023)
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Journal Article
Evaluation of a Dual PI3K/mTOR Inhibitor PF-04691502 against Bladder Cancer Cells
Shang, Xiaosong, Na, Xinyu, Wang, Lei, Yang, Zhiqin, Ren, Pengpeng
Published in Evidence-based complementary and alternative medicine (24.06.2022)
Published in Evidence-based complementary and alternative medicine (24.06.2022)
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Journal Article
Research on a High-Threshold-Voltage AlGaN/GaN HEMT with P-GaN Cap and Recessed Gate in Combination with Graded AlGaN Barrier Layer
Chen, Zhichao, Cai, Lie, Niu, Kai, Xu, Chaozhi, Lin, Haoxiang, Ren, Pengpeng, Sun, Dong, Lin, Haifeng
Published in Journal of electronic materials (01.05.2024)
Published in Journal of electronic materials (01.05.2024)
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Journal Article
New Insights Into the Physics-Based Statistical Compact Modeling of Flicker Noise in Advanced FinFET Technology
Ren, Pengpeng, Wu, Junjie, Zhang, Chenyang, Xue, Yongkang, Yang, Sheng, Wang, Shuying, Wang, Runsheng, Ji, Zhigang, Huang, Ru
Published in IEEE transactions on electron devices (01.05.2024)
Published in IEEE transactions on electron devices (01.05.2024)
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Journal Article
A Device-Circuit Aging Simulation Framework Integrating Trap-Based Models and Sensitivity Analysis for FinFET Technology
Li, Yu, Xue, Yongkang, Sun, Zixuan, Shen, Cong, Ren, Pengpeng, Ji, Zhigang, Zhang, Lining, Wang, Runsheng, Huang, Ru
Published in IEEE transactions on electron devices (01.01.2024)
Published in IEEE transactions on electron devices (01.01.2024)
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Journal Article
Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation With Both High Accuracy and Efficiency
Liu, Xiang, Ren, Pengpeng, Chen, Haibao, Ji, Zhigang, Liu, Junhua, Wang, Runsheng, Zhang, Jianfu, Huang, Ru
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.04.2023)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.04.2023)
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Journal Article
On the Understanding and Modeling of Non-Negligible Subthreshold-State Degradation (SSD) in Sub-20-nm DRAM Technology
Wang, Da, Xue, Yongkang, Liu, Yong, Ren, Pengpeng, Sun, Zixuan, Wang, Zirui, Cheng, Zhijun, Yang, Haiyang, Liu, Xiangli, Wu, Blacksmith, Cao, Kanyu, Ji, Zhigang, Wang, Runsheng, Huang, Ru
Published in IEEE electron device letters (01.09.2024)
Published in IEEE electron device letters (01.09.2024)
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Journal Article
Step-recovery with Multi-pulse Test (SRMPT) Characterization Technique for the Understanding of Border Traps in Ferroelectric Capacitors
Wu, Yishan, Liu, Zhiwei, Wu, Maokun, Cai, Puyang, Wang, Xuepei, Liu, Jinhao, Cui, Boyao, Wu, Junjie, Wen, Yichen, Wang, Runsheng, Ye, Sheng, Ren, Pengpeng, Ji, Zhigang, Huang, Ru
Published in IEEE electron device letters (05.08.2024)
Published in IEEE electron device letters (05.08.2024)
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Journal Article
A Thermal Profile Prediction Methodology for Nanosheet Circuits Featuring Cross-Layer Thermal Coupling Effect
Wang, Shuying, Zhang, Yewei, Kim, Yunjoong, Ren, Pengpeng, Ji, Zhigang
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding