by Ng, Ray Jia Hong, Krishnan, Ravikumar Venkat, Wang, Hao, Yang, Joel K.W.
Published in Nanophotonics (Berlin, Germany) (01.02.2020)

by Ng, Ray Jia Hong, Krishnan, Ravikumar Venkat, Wang, Hao, Yang, Joel K.W.
Published in Nanophotonics (Berlin, Germany) (01.11.2020)

by PEY KIN LEONG, RAVIKUMAR VENKAT KRISHNAN, CHIN JIANN MIN, YANG JOEL KWANG WEI
Year of Publication 13.05.2022

by Somasundaram, Vasanth, Xuan, Seah Yi, Phoa, Angeline, Lua, Winson, Meng, Chua Choon, Krishnan Ravikumar, Venkat
Published in 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2019)

by Lua, Winson, Phoa, Angeline, Ranganathan, Gopinath, A.S., Girish, Ravikumar, Venkat Krishnan, Tan, Abel
Published in Microelectronics and reliability (01.03.2020)

by Ranganathan, Gopinath, Ravikumar, Venkat-Krishnan, Phoa, Angeline, Chea-Wei Teo
Published in 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.06.2015)

by Ng, Ray Jia Hong, Krishnan, Ravikumar Venkat, Dong, Zhaogang, Ho, Jinfa, Liu, Hailong, Ruan, Qifeng, Pey, Kin Leong, Yang, Joel K. W.
Published in Optical materials express (01.02.2019)

by Ravikumar, Venkat Krishnan
Published in 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2016)

by Lua, Winson, Ravikumar, Venkat Krishnan, Phoa, Angeline
Published in 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2018)

by YANG, Joel Kwang Wei, RAVIKUMAR, Venkat Krishnan, CHIN, Jiann Min, PEY, Kin Leong
Year of Publication 13.03.2024

by Winson, Lua, Angeline, Phoa, Ranganathan, Gopinath, Girish, AS, Krishnan, Ravikumar Venkat
Published in 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2019)

by YANG, Joel Kwang Wei, RAVIKUMAR, Venkat Krishnan, CHIN, Jiann Min, PEY, Kin Leong
Year of Publication 23.11.2022

by YANG, Joel Kwang Wei, RAVIKUMAR, Venkat Krishnan, CHIN, Jiann Min, PEY, Kin Leong
Year of Publication 03.08.2022

by Winson Lua, Ranganathan, Gopinath, Ravikumar, Venkat Krishnan, Phoa, Angeline
Published in 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2016)

by Ravikumar, Venkat Krishnan, Wei, Joel Yang Kwang, Chin, Jiann Min, Leong, Pey Kin
Year of Publication 21.09.2021

by RAVIKUMAR, Venkat Krishnan, CHIN, Jiann Min, LEONG, Pey Kin, WEI, Joel Yang Kwang
Year of Publication 01.04.2021

by Ravikumar, Venkat Krishnan, Wei, Joel Yang Kwang, Chin, Jiann Min, Leong, Pei Kin
Year of Publication 01.04.2021

by Lua, Winson, Soon-Huat Lim, Ravikumar, Venkat Krishnan, Phoa, Angelina
Published in 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2017)

by KRISHNAN, Ravikumar Venkat, YANG, Kwang Wei Joel, NG, Jia Hong Ray
Year of Publication 10.09.2020

by Ravikumar, Venkat Krishnan, Chin, Jiann Minn, Linarto, Nathan, Hong, Abel Tan Yew, Phoa, Shei Lay, Lua, Wen Tsann, Ranganathan, Gopinath
Year of Publication 25.03.2021