METHODS FOR ASSESSING SEMICONDUCTOR STRUCTURES
LIBBERT JEFFREY L, WANG GANG, KOMMU SRIKANTH, PEIDOUS IGOR, RAPOPORT IGOR
Year of Publication 27.12.2021
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Year of Publication 27.12.2021
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반도체 구조들을 평가하기 위한 방법들
LIBBERT JEFFREY L, WANG GANG, KOMMU SRIKANTH, PEIDOUS IGOR, RAPOPORT IGOR
Year of Publication 14.10.2019
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Year of Publication 14.10.2019
Patent
Novel Approach for Silicon Contamination Monitoring Using Surface Photo-voltage Measurements
Rapoport, Igor, Taylor, Patrick, Kim, Seung-Bae, Orschel, Benno, Huber, Walter, Kearns, Joel
Published in ECS transactions (07.07.2006)
Published in ECS transactions (07.07.2006)
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Journal Article
Photoluminescence as Complimentary Technique for Metals Contamination Monitoring After Thermal Processing
Rapoport, Igor, Taylor, Patrick, Kim, Seung-Bae, Orschel, Benno
Published in ECS transactions (07.02.2007)
Published in ECS transactions (07.02.2007)
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Journal Article
Iron Cross-Contamination Dynamics at Elevated Temperatures in Oxygen Gas Flow
Rapoport, Igor, Taylor, Patrick, Orschel, Benno, Kirscht, Fritz, Kearns, Joel
Published in ECS transactions (07.07.2006)
Published in ECS transactions (07.07.2006)
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Journal Article
A 1.8mW 450-900MHz ±15ps period jitter programmable multi-output clock generator with high supply noise tolerance in 28-nm CMOS process
Odedara, Bhavin, Bojja, Srikanth, Gupta, Nitin, Rapoport, Igor, Ross, Tony, Zelichenok, Alik
Published in 2017 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC) (01.10.2017)
Published in 2017 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC) (01.10.2017)
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Conference Proceeding
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Young-Lai, Matthew, Semere, Jean, Haggarty, Ryan Matthew, Foox-Rapoport, Igor, Levitte, George Jacob, Kuminov, Dany, Dabrowski, Michal, Wang, Wan, Wood, Duncan Geoffrey Hector, Gharaibeh, Abdullah Hassan, Vyas, Bhavin
Year of Publication 23.04.2024
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Year of Publication 23.04.2024
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Methods for assessing semiconductor structures
Wang, Gang, Libbert, Jeffrey L, Rapoport, Igor, Kommu, Srikanth, Peidous, Igor
Year of Publication 03.08.2021
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Year of Publication 03.08.2021
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METHODS FOR ASSESSING SEMICONDUCTOR STRUCTURES
KOMMU, Srikanth, RAPOPORT, Igor, WANG, Gang, LIBBERT, Jeffrey L, PEIDOUS, Igor
Year of Publication 28.07.2021
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Year of Publication 28.07.2021
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METHODS FOR ASSESSING SEMICONDUCTOR STRUCTURES
KOMMU, Srikanth, RAPOPORT, Igor, WANG, Gang, LIBBERT, Jeffrey L, PEIDOUS, Igor
Year of Publication 28.04.2021
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Year of Publication 28.04.2021
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METHODS FOR ASSESSING SEMICONDUCTOR STRUCTURES
KOMMU, Srikanth, RAPOPORT, Igor, WANG, Gang, LIBBERT, Jeffrey L, PEIDOUS, Igor
Year of Publication 27.02.2020
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Year of Publication 27.02.2020
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METHODS FOR ASSESSING SEMICONDUCTOR STRUCTURES
Wang, Gang, Libbert, Jeffrey L, Rapoport, Igor, Kommu, Srikanth, Peidous, Igor
Year of Publication 20.02.2020
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Year of Publication 20.02.2020
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METHODS FOR ASSESSING SEMICONDUCTOR STRUCTURES
KOMMU, Srikanth, RAPOPORT, Igor, WANG, Gang, LIBBERT, Jeffrey L, PEIDOUS, Igor
Year of Publication 18.12.2019
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Year of Publication 18.12.2019
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Methods for assessing semiconductor structures
Wang, Gang, Libbert, Jeffrey L, Rapoport, Igor, Kommu, Srikanth, Peidous, Igor
Year of Publication 26.11.2019
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Year of Publication 26.11.2019
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Young-Lai, Matthew, Semere, Jean, Haggarty, Ryan Matthew, Foox-Rapoport, Igor, Levitte, George Jacob, Kuminov, Dany, Dabrowski, Michal, Wang, Wan, Wood, Duncan Geoffrey Hector, Gharaibeh, Abdullah Hassan, Vyas, Bhavin
Year of Publication 04.08.2022
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Year of Publication 04.08.2022
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METHODS FOR ASSESSING SEMICONDUCTOR STRUCTURES
KOMMU, Srikanth, RAPOPORT, Igor, WANG, Gang, LIBBERT, Jeffrey L, PEIDOUS, Igor
Year of Publication 27.09.2019
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Year of Publication 27.09.2019
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Young-Lai, Matthew, Semere, Jean, Haggarty, Ryan Matthew, Foox-Rapoport, Igor, Levitte, George Jacob, Kuminov, Dany, Dabrowski, Michal, Wang, Wan, Wood, Duncan Geoffrey Hector, Gharaibeh, Abdullah Hassan, Vyas, Bhavin
Year of Publication 24.05.2022
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Year of Publication 24.05.2022
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