Conductivity and Charge Trapping After Electrical Stress in Amorphous and Polycrystalline Al2O3-Based Devices Studied With AFM-Related Techniques
LANZA, Mario, PORTI, Marc, PIOTR MICHALOWSKI, Pawel, NAFRIA, Montserrat, AYMERICH, Xavier, BENSTETTER, Giinther, LODERMEIER, Edgar, RANZINGER, Heiko, JASCHKE, Gert, TEICHERT, Steffen, WILDE, Lutz
Published in IEEE transactions on nanotechnology (01.03.2011)
Published in IEEE transactions on nanotechnology (01.03.2011)
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Journal Article
Conductivity and Charge Trapping After Electrical Stress in Amorphous and Polycrystalline [Formula Omitted] Devices Studied With AFM-Related Techniques
Lanza, Mario, Porti, Marc, Nafría, Montserrat, Aymerich, Xavier, Benstetter, Günther, Lodermeier, Edgar, Ranzinger, Heiko, Jaschke, Gert, Teichert, Steffen, Wilde, Lutz, Michalowski, Pawel Piotr
Published in IEEE transactions on nanotechnology (01.03.2011)
Published in IEEE transactions on nanotechnology (01.03.2011)
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Journal Article
Conductivity and Charge Trapping After Electrical Stress in Amorphous and Polycrystalline hbox Al 2 hbox O 3 hbox - Based Devices Studied With AFM-Related Techniques
Lanza, Mario, Porti, Marc, Nafria, Montserrat, Aymerich, Xavier, Benstetter, Guenther, Lodermeier, Edgar, Ranzinger, Heiko, Jaschke, Gert, Teichert, Steffen, Wilde, Lutz, Michalowski, Pawel Piotr
Published in IEEE transactions on nanotechnology (01.03.2011)
Published in IEEE transactions on nanotechnology (01.03.2011)
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Journal Article
Conductivity and Charge Trapping After Electrical Stress in Amorphous and Polycrystalline \hbox\hbox\hbox Devices Studied With AFM-Related Techniques
Lanza, Mario, Porti, Marc, Nafría, Montserrat, Aymerich, Xavier, Benstetter, Günther, Lodermeier, Edgar, Ranzinger, Heiko, Jaschke, Gert, Teichert, Steffen, Wilde, Lutz, Michalowski, Pawel Piotr
Published in IEEE transactions on nanotechnology (01.03.2011)
Published in IEEE transactions on nanotechnology (01.03.2011)
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AFM-based scanning capacitance techniques for deep sub-micron semiconductor failure analysis
BENSTETTER, Guenther, BREITSCHOPF, Peter, FRAMMELSBERGER, Werner, RANZINGER, Heiko, REISLHUBER, Peter, SCHWEINBOECK, Thomas
Published in Microelectronics and reliability (01.09.2004)
Published in Microelectronics and reliability (01.09.2004)
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