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"RAINER SCHIERLE"
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"RAINER SCHIERLE"
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Grazing and normal incidence interferometer having common reference surface
by
KAVALDJIEV DANIEL IVANOV
,
MUELLER DIETER
,
SCHIERLE RAINER
Year of Publication
01.03.2016
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METHOD AND DEVICE FOR PATTERN RECOGNITION IN ACOUSTIC RECORDINGS
by
SCHIERLE RAINER
Year of Publication
01.03.2007
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Method and Apparatus for Pattern Recognition in Acoustic Recordings
by
SCHIERLE
,
RAINER
Year of Publication
28.02.2007
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Grazing and Normal Incidence Interferometer Having Common Reference Surface
by
KAVALDJIEV DANIEL IVANOV
,
MUELLER DIETER
,
SCHIERLE RAINER
Year of Publication
13.11.2014
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Grazing and normal incidence interferometer having common reference surface
by
KAVALDJIEV DANIEL
,
MULLER DIETER
,
SCHIERLE RAINER
Year of Publication
22.07.2014
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Reduced coherence symmetric grazing incidence differential interferometer
by
KAVALDJIEV DANIEL IVANOV
,
MUELLER DIETER
,
SCHIERLE RAINER
Year of Publication
13.11.2008
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Reduced coherence symmetric grazing incidence differential interferometer
by
Mueller, Dieter
,
Schierle
,
Rainer
,
Kavaldjiev, Daniel
Year of Publication
06.02.2007
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Reduced coherence symmetric grazing incidence differential interferometer
by
KAVALDJIEV DANIEL
,
MUELLER DIETER
,
SCHIERLE RAINER
Year of Publication
06.02.2007
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Reduced coherence symmetric grazing incidence differential interferometer
by
KAVALDJIEV DANIEL I
,
MUELLER DIETER
,
SCHIERLE RAINER
Year of Publication
15.06.2006
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Reduced coherence symmetric grazing incidence differential interferometer
by
KAVALDJIEV DANIEL IVANOV
,
MUELLER DIETER
,
SCHIERLE RAINER
Year of Publication
06.06.2006
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Reduced coherence symmetric grazing incidence differential interferometer
by
Mueller, Dieter
,
Kavaldjiev, Daniel Ivanov
,
Schierle
,
Rainer
Year of Publication
06.06.2006
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REDUCED COHERENCE SYMMETRIC GRAZING INCIDENCE DIFFERENTIAL INTERFEROMETER
by
MUELLER, DEITER
,
SCHIERLE
,
RAINER
,
KAVALDJIEV, DANIEL IVANOV
Year of Publication
01.12.2004
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REDUCED COHERENCE SYMMETRIC GRAZING INCIDENCE DIFFERENTIAL INTERFEROMETER
by
MUELLER, DEITER
,
SCHIERLE
,
RAINER
,
KAVALDJIEV, DANIEL IVANOV
Year of Publication
05.02.2003
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Reduced coherence symmetric grazing incidence differential interferometer
by
DEITER MUELLER
,
DANIEL IVANOV KAVALDJIEV
,
RAINER SCHIERLE
Year of Publication
23.10.2001
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REDUCED COHERENCE SYMMETRIC GRAZING INCIDENCE DIFFERENTIAL INTERFEROMETER
by
KAVALDJIEV, DANIEL, IVANOV
,
MUELLER, DEITER
,
SCHIERLE
,
RAINER
Year of Publication
18.10.2001
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Systems configured to perform a non-contact method for determining a property of a specimen
by
Samsavar, Amin
,
Schmidt, John M
,
Schierle
,
Rainer
,
Horner, Gregory S
,
Miller, Thomas G
,
Xu, Zhiwei
,
Hu, Xiaofeng
,
Shi, Jianou
,
Edelstein, Sergio
Year of Publication
18.05.2010
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Systems configured to perform a non-contact method for determining a property of a specimen
by
HORNER GREGORY S
,
XU ZHIWEI
,
SCHMIDT JOHN M
,
SHI JIANOU
,
EDELSTEIN SERGIO
,
SAMSAVAR AMIN
,
MILLER THOMAS G
,
HU XIAOFENG
,
SCHIERLE RAINER
Year of Publication
18.05.2010
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Contactless charge measurement of product wafers and control of corona generation and deposition
by
Samsavar, Amin
,
Schmidt, John M
,
Schierle
,
Rainer
,
Horner, Gregory S
,
Miller, Thomas G
,
Xu, Zhiwei
,
Hu, Xiaofeng
,
Shi, Jianou
,
Edelstein, Sergio
Year of Publication
26.05.2009
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Contactless charge measurement of product wafers and control of corona generation and deposition
by
HORNER GREGORY S
,
XU ZHIWEI
,
SCHMIDT JOHN M
,
SHI JIANOU
,
EDELSTEIN SERGIO
,
SAMSAVAR AMIN
,
MILLER THOMAS G
,
HU XIAOFENG
,
SCHIERLE RAINER
Year of Publication
26.05.2009
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Contactless charge measurement of product wafers and control of corona generation and deposition
by
HORNER GREGORY S
,
XU ZHIWEI
,
SCHMIDT JOHN M
,
SHI JIANOU
,
EDELSTEIN SERGIO
,
SAMSAVAR AMIN
,
MILLER THOMAS G
,
HU XIAOFENG
,
SCHIERLE RAINER
Year of Publication
24.07.2007
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