A subthreshold low-power CMOS LC-VCO with high immunity to PVT variations
Ghorbel, Imen, Haddad, Fayrouz, Rahajandraibe, Wenceslas, Loulou, Mourad
Published in Analog integrated circuits and signal processing (01.12.2017)
Published in Analog integrated circuits and signal processing (01.12.2017)
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Journal Article
Design of Reconfigurable Inductorless RF VCO in 130 nm CMOS
Haddad, Fayrouz, Ghorbel, Imen, Haddad, Fayrouz, Rahajandraibe, Wenceslas, Loulou, Mourad
Published in BioNanoScience (01.06.2019)
Published in BioNanoScience (01.06.2019)
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Journal Article
Negative Group Delay Theory on Li Topology
Ravelo, Blaise, Wu, Lili, Wan, Fayu, Rahajandraibe, Wenceslas, Murad, Nour Mohammad
Published in IEEE access (2020)
Published in IEEE access (2020)
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Journal Article
0IO-Shape PCB Trace Negative Group-Delay Analysis
Wan, Fayu, Liu, Bin, Thakur, Preeti, Thakur, Atul, Lallechere, Sebastien, Rahajandraibe, Wenceslas, Ravelo, Blaise
Published in IEEE access (2020)
Published in IEEE access (2020)
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Journal Article
0IO-Shape PCB Trace Negative Group-Delay Analysis
Wan, Fayu, Liu, Bin, Thakur, Preeti, Thakur, Atul, Lallechere, Sebastien, Rahajandraibe, Wenceslas, Ravelo, Blaise
Published in IEEE access (2020)
Published in IEEE access (2020)
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Journal Article
Innovative Transient Study of Tri-Bandpass Negative Group Delay Applied to Microstrip Barcode-Circuit
Wu, Lili, Wan, Fayu, Mefteh, Rym Assila Belhadj, Vauche, Remy, Chan, George, Zhou, Xiang, Haddad, Fayrouz, Rahajandraibe, Wenceslas, Ravelo, Blaise
Published in IEEE access (2021)
Published in IEEE access (2021)
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Journal Article
Event Driven Modeling and Characterization of the Second Order Voltage Switched Charge Pump PLL
Ali, Ehsan, Hangmann, Christian, Hedayat, Christian, Haddad, Fayrouz, Rahajandraibe, Wenceslas, Hilleringmann, Ulrich
Published in IEEE transactions on circuits and systems. I, Regular papers (01.03.2016)
Published in IEEE transactions on circuits and systems. I, Regular papers (01.03.2016)
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Journal Article
Original Theory of NGD Low Pass-High Pass Composite Function for Designing Inductorless BP NGD Lumped Circuit
Ravelo, Blaise, Ngoho, Samuel, Fontgalland, Glauco, Rajaoarisoa, Lala, Rahajandraibe, Wenceslas, Vauche, Remy, Xu, Zhifei, Wan, Fayu, Ge, Junxiang, Lallechere, Sebastien
Published in IEEE access (2020)
Published in IEEE access (2020)
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Journal Article
An Energy-Efficient Tunable CMOS UWB Pulse Generator
Barraj, Imen, Trabelsi, Hatem, Rahajandraibe, Wenceslas, Masmoudi, Mohamed
Published in BioNanoScience (01.06.2015)
Published in BioNanoScience (01.06.2015)
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Journal Article
Electrothermal Analyses of Bandpass NGD RLC-Network Topologies
Sambatra, E. J. R., Ngoho, S., Haddad, F., Guerin, M., Fontgalland, G., Rahajandraibe, W., Ravelo, B.
Published in Advanced electromagnetics (11.03.2023)
Published in Advanced electromagnetics (11.03.2023)
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Journal Article
Stop-band type NGD RLC-resonant circuit sensitivity analysis
Sambatra, J. R., Haddad, F., Ngoho, S., Guerin, M., Rahajandraibe, W., Bilal, G. H., Fontgalland, G., Silva, H. S., Ravelo, B.
Published in Advanced electromagnetics (01.01.2023)
Published in Advanced electromagnetics (01.01.2023)
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Journal Article
Design of fully-integrated RF front-end for large image rejection and wireless communication applications
Fayrouz, Haddad, Wenceslas, Rahajandraibe, Lakhdar, Zaid, Oussama, Frioui
Published in 2010 17th IEEE International Conference on Electronics, Circuits and Systems (01.12.2010)
Published in 2010 17th IEEE International Conference on Electronics, Circuits and Systems (01.12.2010)
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Conference Proceeding
A CMOS adaptive RF front-end receiver for wireless applications
Haddad, Fayrouz, Rahajandraibe, Wenceslas, Zaïd, Lakhdar, Frioui, Oussama
Published in International journal of electronics (01.03.2012)
Published in International journal of electronics (01.03.2012)
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Journal Article
Electrical model of an inverter body-biased structure in triple-well technology under pulsed photoelectric laser stimulation
Borrel, N., Champeix, C., Kussener, E., Rahajandraibe, W., Lisart, M., Dutertre, J.-M., Sarafianos, A.
Published in Microelectronics and reliability (01.08.2015)
Published in Microelectronics and reliability (01.08.2015)
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Journal Article