by Trojman, Lionel, Ragnarsson, Lars-Ake, Collaert, Nadine
Published in IEEE transactions on electron devices (01.11.2014)

by Gallagher, Emily, Ragnarsson, Lars-Ake, Rolin, Cedric
Published in IEEE transactions on semiconductor manufacturing (18.06.2024)

by CHO, Moonju, AKHEYAR, Amal, AOULAICHE, Marc, DEGRAEVE, Robin, RAGNARSSON, Lars-Ake, TSENG, Joshua, HOFFMANN, Thomas Y, GROESENEKEN, Guido
Published in Solid-state electronics (01.08.2011)

by Wu, Zhicheng, Franco, Jacopo, Vandooren, Anne, Arimura, Hiroaki, Ragnarsson, Lars-Ake, Roussel, Philippe, Kaczer, Ben, Linten, Dimitri, Collaert, Nadine, Groeseneken, Guido
Published in IEEE transactions on electron devices (01.03.2022)

by Moonju Cho, Jae-Duk Lee, Aoulaiche, M., Kaczer, B., Roussel, P., Kauerauf, T., Degraeve, R., Franco, J., Ragnarsson, L., Groeseneken, G.
Published in IEEE transactions on electron devices (01.08.2012)

by Toledano-Luque, Maria, Matagne, Philippe, Sibaja-Hernandez, Arturo, Chiarella, Thomas, Ragnarsson, Lars-Ake, Soree, Bart, Cho, Moonju, Mocuta, Anda, Thean, Aaron
Published in IEEE electron device letters (01.12.2014)

by Alam, Md. Nur Kutubul, Kaczer, Ben, Ragnarsson, Lars-Ake, Popovici, Mihaela, Rzepa, Gerhard, Horiguchi, Naoto, Heyns, Marc, Van Houdt, Jan
Published in IEEE journal of the Electron Devices Society (2019)

by Parihar, Narendra, Arutchelvan, Goutham, Franco, Jacopo, Baudot, Sylvain, Opedebeeck, Ann, Demuynck, Steven, Arimura, Hiroaki, Ragnarsson, Lars-Ake, Mitard, Jerome, De Heyn, Vincent, Mercha, Abdelkarim
Published in 2021 IEEE International Integrated Reliability Workshop (IIRW) (04.10.2021)

by Vereecke, Guy, De Coster, Hanne, Van Alphen, Senne, Carolan, Patrick, Bender, Hugo, Willems, Kherim, Ragnarsson, Lars-Åke, Van Dorpe, Pol, Horiguchi, Naoto, Holsteyns, Frank
Published in Microelectronic engineering (15.11.2018)

by Cho, Moonju, Kaczer, Ben, Kauerauf, Thomas, Ragnarsson, Lars-Ake, Groeseneken, Guido
Published in IEEE electron device letters (01.05.2013)

by Ramesh, Sivaramakrishnan, Ajaykumar, Arjun, Ragnarsson, Lars-Åke, Breuil, Laurent, El Hajjam, Gabriel, Kaczer, Ben, Belmonte, Attilio, Nyns, Laura, Soulié, Jean-Philippe, Van den bosch, Geert, Rosmeulen, Maarten
Published in Micromachines (Basel) (08.09.2021)

by Trojman, L., Pantisano, L., Ragnarsson, L.
Published in IEEE transactions on electron devices (01.07.2012)

by Lee, Jae Woo, Simoen, Eddy, Veloso, Anabela, Cho, Moon Ju, Boccardi, Guillaume, Ragnarsson, Lars-Åke, Chiarella, Thomas, Horiguchi, Naoto, Groeseneken, Guido, Thean, Aaron
Published in ACS applied materials & interfaces (25.09.2013)

by CHO, Moonju, KACZER, Ben, AOULAICHE, Marc, DEGRAEVE, Robin, ROUSSEL, Philippe, FRANCO, Jacopo, KAUERAUF, Thomas, RAGNARSSON, Lars Ake, HOFFMANN, Thomas Y, GROESENEKEN, Guido
Published in IEEE transactions on electron devices (01.10.2011)

by Bhoir, Mandar S., Chiarella, Thomas, Ragnarsson, Lars Ake, Mitard, Jerome, Terzeiva, Valentina, Horiguchi, Naoto, Mohapatra, Nihar R.
Published in IEEE journal of the Electron Devices Society (2019)

by O'CONNOR, Robert, HUGHES, Greg, KAUERAUF, Thomas, RAGNARSSON, Lars-Ake
Published in Microelectronics and reliability (01.06.2011)

by Hellings, Geert, Subirats, Alexandre, Franco, Jacopo, Schram, Tom, Ragnarsson, Lars-Ake, Witters, Liesbeth, Roussel, Philippe, Linten, Dimitri, Horiguchi, Naoto, Boschke, Roman
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)

by Veloso, Anabela, Chew, Soon Aik, Higuchi, Yuichi, Ragnarsson, Lars-$Å$ke, Simoen, Eddy, Schram, Tom, Witters, Thomas, Van Ammel, Annemie, Dekkers, Harold, Tielens, Hilde, Devriendt, Katia, Heylen, Nancy, Sebaai, Farid, Brus, Stephan, Favia, Paola, Geypen, Jef, Bender, Hugo, Phatak, Anup, Chen, Michael S, Lu, Xinliang, Ganguli, Seshadri, Lei, Yu, Tang, Wei, Fu, Xinyu, Gandikota, Srinivas, Noori, Atif, Brand, Adam, Yoshida, Naomi, Thean, Aaron, Horiguchi, Naoto
Published in Japanese Journal of Applied Physics (01.04.2013)

by Delabie, Annelies, Caymax, Matty, Brijs, Bert, Brunco, David P., Conard, Thierry, Sleeckx, Erik, Van Elshocht, Sven, Ragnarsson, Lars-Åke, De Gendt, Stefan, Heyns, Marc M.
Published in Journal of the Electrochemical Society (01.01.2006)

by Xiao Zhang, Mitard, J., Ragnarsson, L., Hoffmann, T., Deal, M., Grubbs, M. E., Jing Li, Magyari-Kope, B., Clemens, B. M., Nishi, Y.
Published in IEEE transactions on electron devices (01.11.2012)