DROP PLACEMENT EVALUATION
Srinivasan, Yeshwanth, Longsine, Whitney, Truskett, Van Nguyen, Traub, Matthew C, Rafferty, Tom H
Year of Publication 25.04.2019
Get full text
Year of Publication 25.04.2019
Patent
INTERFEROMETRIC ANALYSIS FOR THE MANUFACTURE OF NANO-SCALE DEVICES
SCHUMAKER, Philip, D, RAFFERTY, Tom H, CHOI, Byung-Jin, NIMMAKAYALA, Pawan K, BABBS, Daniel, A, TRUSKETT, Van, N, AGHILI, Alireza
Year of Publication 09.08.2017
Get full text
Year of Publication 09.08.2017
Patent
Enhanced multi channel alignment
NIMMAKAYALA PAWAN KUMAR, RAFFERTY TOM H, SCHUMAKER PHILIP D, CHOI BYUNG-JIN
Year of Publication 31.08.2010
Get full text
Year of Publication 31.08.2010
Patent
Enhanced multi channel alignment
Nimmakayala, Pawan Kumar, Choi, Byung-Jin, Rafferty, Tom H, Schumaker, Philip D
Year of Publication 31.08.2010
Get full text
Year of Publication 31.08.2010
Patent
Interferometric analysis method for the manufacture of nano-scale devices
BABBS DANIEL A, NIMMAKAYALA PAWAN KUMAR, RAFFERTY TOM H, TRUSKETT VAN NGUYEN, SCHUMAKER PHILIP D, AGHILI ALIREZA, CHOI BYUNG-JIN
Year of Publication 01.02.2011
Get full text
Year of Publication 01.02.2011
Patent
INTERFEROMETRIC ANALYSIS FOR THE MANUFACTURE OF NANO-SCALE DEVICES
SCHUMAKER, PHILIP, D, AGHILI, ALIREZA, BABBS, DANIEL, A, RAFFERTY, TOM H, CHOI, BYUNG-JIN, NIMMAKAYALA, PAWAN K, TRUSKETT, VAN, N
Year of Publication 22.12.2010
Get full text
Year of Publication 22.12.2010
Patent
Enhanced Multi Channel Alignment
NIMMAKAYALA PAWAN KUMAR, RAFFERTY TOM H, SCHUMAKER PHILIP D, CHOI BYUNG-JIN
Year of Publication 02.07.2009
Get full text
Year of Publication 02.07.2009
Patent
Alignment Using Moire Patterns
RAFFERTY TOM H, KHUSNATDINOV NIYAZ, LABRAKE DWAYNE L, SCHUMAKER PHILIP D
Year of Publication 11.06.2009
Get full text
Year of Publication 11.06.2009
Patent
Interferometric Analysis Method for the Manufacture of Nano-Scale Devices
BABBS DANIEL A, NIMMAKAYALA PAWAN KUMAR, RAFFERTY TOM H, TRUSKETT VAN NGUYEN, SCHUMAKER PHILIP D, AGHILI ALIREZA, CHOI BYUNG-JIN
Year of Publication 18.02.2010
Get full text
Year of Publication 18.02.2010
Patent
Interferometric analysis method for the manufacture of nano-scale devices
BABBS DANIEL A, NIMMAKAYALA PAWAN KUMAR, RAFFERTY TOM H, SCHUMAKER PHILIP D, AGHILI ALIREZA, CHOI BYUNG-JIN, TRUSKETT VAN N
Year of Publication 08.12.2009
Get full text
Year of Publication 08.12.2009
Patent
Interferometric analysis method for the manufacture of nano-scale devices
Nimmakayala, Pawan Kumar, Rafferty, Tom H, Aghili, Alireza, Choi, Byung-Jin, Schumaker, Philip D, Babbs, Daniel A, Truskett, Van N
Year of Publication 08.12.2009
Get full text
Year of Publication 08.12.2009
Patent