Characterization of photovoltage evolution of ZnO films using a scanning Kelvin probe system
Li, W., Wu, C.W., Qin, W.G., Wang, G.C., Lu, S.Q., Dong, X.J., Dong, H.B., Sun, Q.L.
Published in Physica. B, Condensed matter (01.08.2009)
Published in Physica. B, Condensed matter (01.08.2009)
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