Embedded STT-MRAM in 28-nm FDSOI Logic Process for Industrial MCU/IoT Application
Lee, Yong Kyu, Jung, Hyunsung, Lee, Kilho, Shin, HyunChul, Jung, Hyuntaek, Pyo, Mark, Antonyan, Artur, Lee, Daesop, Hwang, Sohee, Jang, Daehyun, Ji, Yongsung, Song, Yoonjong, Lee, Seungbae, Lim, Jungman, Koh, Kwan-Hyeob, Hwang, Kihyun, Hong, Hyeongsun, Park, Kichul, Jeong, Gitae, Yoon, Jong Shik, Jung, E.S., Kim, JooChan, Oh, SeChung, Bae, Byoung-Jae, Lee, SangHumn, Lee, JungHyuk, Pi, UngHwan, Seo, Boyoung
Published in 2018 IEEE Symposium on VLSI Technology (01.06.2018)
Published in 2018 IEEE Symposium on VLSI Technology (01.06.2018)
Get full text
Conference Proceeding