2D vs 3D NAND technology: Reliability benchmark
Righetti, Niccolo, Puzzilli, Giuseppina
Published in 2017 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2017)
Published in 2017 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2017)
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Conference Proceeding
Characterization of charge trapping in SiO2/Al2O3 dielectric stacks by pulsed C-V technique
PUZZILLI, Giuseppina, GOVOREANU, Bogdan, IRRERA, Fernanda, ROSMEULEN, Maarten, VAN HOUDT, Jan
Published in Microelectronics and reliability (01.04.2007)
Published in Microelectronics and reliability (01.04.2007)
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Conference Proceeding
Journal Article
Reliability and modeling: What to simulate and how?
Zhang, Rui, Verzellesi, Giovanni, Puzzilli, Giuseppina, Puschkarsky, Katja, LaRow, Charles, Shluger, Alexander, Tkachev, Yuri, Villena, Marco A., Yang, Kexin, Metaev, Elnatan, Pesic, Milan, Lloyd, Jim, Ring, Matt, Paliwoda, Peter, Tan, Sheldon, Young, Chadwin
Published in 2017 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2017)
Published in 2017 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2017)
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Conference Proceeding
Crested barrier in the tunnel stack of non-volatile memories
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Journal Article
Conference Proceeding
Latent read disturb mitigation in memory devices
Righetti, Niccolo, Puzzilli, Giuseppina, Shukla, Pitamber, Stoller, Scott Anthony
Year of Publication 19.12.2023
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Year of Publication 19.12.2023
Patent
LATENT READ DISTURB MITIGATION IN MEMORY DEVICES
Righetti, Niccolo, Puzzilli, Giuseppina, Shukla, Pitamber, Stoller, Scott Anthony
Year of Publication 29.09.2022
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Year of Publication 29.09.2022
Patent
MITIGATING SLOW READ DISTURB IN A MEMORY SUB-SYSTEM
Malshe, Ashutosh, Puzzilli, Giuseppina, Tehrani, Saeed Sharifi, Rayaprolu, Vamsi Pavan, Muchherla, Kishore Kumar
Year of Publication 06.06.2024
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Year of Publication 06.06.2024
Patent
DECK RESET READ
PUZZILLI, Giuseppina, FASTOW, Richard, SUN, Xin, PARAT, Krishna K, ZHANG, Chao
Year of Publication 18.04.2024
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Year of Publication 18.04.2024
Patent
Mitigating slow read disturb in a memory sub-system
Malshe, Ashutosh, Puzzilli, Giuseppina, Tehrani, Saeed Sharifi, Rayaprolu, Vamsi Pavan, Muchherla, Kishore Kumar
Year of Publication 26.03.2024
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Year of Publication 26.03.2024
Patent
A comprehensive model for oxide degradation
Irrera, Fernanda, Puzzilli, Giuseppina, Caputo, Domenico
Published in Microelectronics and reliability (01.05.2005)
Published in Microelectronics and reliability (01.05.2005)
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Journal Article
Adjusting a preprogram voltage based on use of a memory device
Righetti, Niccolo, Puzzilli, Giuseppina, Shukla, Pitamber, Stoller, Scott A, Venkataraman, Priya
Year of Publication 25.07.2023
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Year of Publication 25.07.2023
Patent
Implementing fault tolerant page stripes on low density memory systems
Goda, Akira, Puzzilli, Giuseppina, Feeley, Peter, Moschiano, Violante, Ratnam, Sampath K, Liu, Yifen, Muchherla, Kishore Kumar, Helm, Mark A
Year of Publication 13.02.2024
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Year of Publication 13.02.2024
Patent
ADJUSTING A PREPROGRAM VOLTAGE BASED ON USE OF A MEMORY DEVICE
Righetti, Niccolo, Puzzilli, Giuseppina, Shukla, Pitamber, Stoller, Scott A, Venkataraman, Priya
Year of Publication 08.12.2022
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Year of Publication 08.12.2022
Patent
Read calibration based on ranges of program/erase cycles
Malshe, Ashutosh, Righetti, Niccolo, McNeil, Jr., Jeffrey S, Muchherla, Kishore K, Puzzilli, Giuseppina, Schuh, Karl D, Rayaprolu, Vamsi Pavan
Year of Publication 24.10.2023
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Year of Publication 24.10.2023
Patent