Heavy Ion-Induced SEE and 60Co TID effects testing on commercial logic devices
Kohler, P., Bosser, A., Rajkowski, T., Saigne, F., Wang, P. X., Sanchez, A., Puybusque, L., Gouyet, L.
Published in 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) (01.11.2020)
Published in 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) (01.11.2020)
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