Electronic structure theory and mechanisms of the oxide trapped hole annealing process
Karna, S.P., Pineda, A.C., Pugh, R.D., Shedd, W.M., Oldham, T.R.
Published in IEEE transactions on nuclear science (01.12.2000)
Published in IEEE transactions on nuclear science (01.12.2000)
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Journal Article
The effects of ionizing radiation on commercial power MOSFETs operated at cryogenic temperatures
Johnson, G.H., Kemp, W.T., Schrimpf, R.D., Galloway, K.F., Ackermann, M.R., Pugh, R.D.
Published in IEEE transactions on nuclear science (01.12.1994)
Published in IEEE transactions on nuclear science (01.12.1994)
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Journal Article
Conference Proceeding
The effect of network topology on proton trapping in amorphous SiO/sub 2
Pineda, A.C., Karna, S.P., Kurtz, H.A., Shedd, W.M., Pugh, R.D.
Published in IEEE transactions on nuclear science (01.12.2001)
Published in IEEE transactions on nuclear science (01.12.2001)
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Journal Article
Microscopic mechanisms of electron trapping by self-trapped holes and protons in amorphous SiO/sub 2
Kama, S.P., Kurtz, H.A., Shedd, W.M., Pugh, R.D.
Published in IEEE transactions on nuclear science (01.12.2000)
Published in IEEE transactions on nuclear science (01.12.2000)
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Journal Article
New fundamental defects in a-SiO/sub 2
Karna, S.P., Kurtz, H.A., Shedd, W.M., Pugh, R.D., Singaraju, B.K.
Published in IEEE transactions on nuclear science (01.12.1999)
Published in IEEE transactions on nuclear science (01.12.1999)
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Journal Article
The effect of network topology on proton trapping in amorphous SiO 2
Pineda, A C, Karna, S P, Kurtz, H A, Shedd, W M, Pugh, R D
Published in IEEE transactions on nuclear science (01.12.2001)
Published in IEEE transactions on nuclear science (01.12.2001)
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Journal Article
The effect of near-interface network strain on proton trapping in SiO/sub 2
Vanheusden, K., Korambath, P.P., Kurtz, H.A., Karna, S.P., Fleetwood, D.M., Shedd, W.M., Pugh, R.D.
Published in IEEE transactions on nuclear science (01.12.1999)
Published in IEEE transactions on nuclear science (01.12.1999)
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Journal Article
Theory of H- in SiO2
EDWARDS, Arthur H, SHEDD, W. M, PUGH, R. D
Published in Journal of non-crystalline solids (01.08.2001)
Published in Journal of non-crystalline solids (01.08.2001)
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Journal Article
Microscopic mechanisms of electron trapping by self-trapped holes and protons in amorphous SiO2
Kama, S.P, Kurtz, H.A, Shedd, W.M, Pugh, R.D
Published in IEEE transactions on nuclear science (01.12.2000)
Published in IEEE transactions on nuclear science (01.12.2000)
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Journal Article
Irradiation response of mobile protons in buried SiO/sub 2/ films
Vanheusden, K., Devine, R.A.B., Schwank, J.R., Fleetwood, D.M., Polcawich, R.G., Warren, W.L., Karna, S.P., Pugh, R.D.
Published in IEEE transactions on nuclear science (01.12.1997)
Published in IEEE transactions on nuclear science (01.12.1997)
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Journal Article
Microscopic structure of the E'/sub /spl delta// center in amorphous SiO/sub 2/: A first principles quantum mechanical investigation
Chavez, J.R., Karna, S.P., Vanheusden, K., Brothers, C.P., Pugh, R.D., Singaraju, B.K., Warren, W.L., Devine, R.A.B.
Published in IEEE transactions on nuclear science (01.12.1997)
Published in IEEE transactions on nuclear science (01.12.1997)
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Journal Article
Microscopic mechanisms of radiation-induced proton density decay in SiO/sub 2/ films
Karna, S.P., Pugh, R.D., Chavez, J.R., Shedd, W., Brothers, C.P., Singaraju, B.K., Vitiello, M., Pacchioni, G., Devine, R.A.B.
Published in IEEE transactions on nuclear science (01.12.1998)
Published in IEEE transactions on nuclear science (01.12.1998)
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Journal Article
New fundamental defects in a-SiO(2)
Karna, S P, Kurtz, H A, Shedd, W M, Pugh, R D, Singaraju, B K
Published in IEEE transactions on nuclear science (01.12.1999)
Published in IEEE transactions on nuclear science (01.12.1999)
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Journal Article
The effect of near-interface network strain on proton trapping in SiO(2)
Vanheusden, K, Korambath, P P, Kurtz, H A, Karna, S P, Fleetwood, D M, Shedd, W M, Pugh, R D
Published in IEEE transactions on nuclear science (01.12.1999)
Published in IEEE transactions on nuclear science (01.12.1999)
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Journal Article
Microscopic mechanisms of radiation-induced proton density decay in SiO(2) films
Karna, S P, Pugh, R D, Chavez, J R, Shedd, W, Brothers, C P, Singaraju, B K, Vitiello, M, Pacchioni, G, Devine, R A B
Published in IEEE transactions on nuclear science (01.12.1998)
Published in IEEE transactions on nuclear science (01.12.1998)
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Journal Article
Mechanism of electron capture and its effect on trapped holes at oxygen-deficient centers in buried oxide
Karna, S.P., Pugh, R.D., Chavez, J.R., Shedd, W., Brothers, C.P., Singaraju, B.K.
Published in 1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) (1998)
Published in 1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) (1998)
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Conference Proceeding
Analytical and experimental dosimetry technique for calibrating a low energy x-ray radiation source
Bellem, R.D., Critchfield, K.L., Pelzl, R.M., Pugh, R.D., Tallon, R.W.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1994)
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Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1994)
Conference Proceeding