LPT and SLPT Measurement Methods of Flat-Band Voltage (VFB) in MOS Devices
Piskorski, Krzysztof, M. Przewłocki, Henryk
Published in Journal of Telecommunications and Information Technology (01.06.2023)
Published in Journal of Telecommunications and Information Technology (01.06.2023)
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Journal Article
Energy concepts involved in MOS characterization
Engström, Olof, Gutt, Tomasz, M. Przewłocki, Henryk
Published in Journal of Telecommunications and Information Technology (01.06.2023)
Published in Journal of Telecommunications and Information Technology (01.06.2023)
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Journal Article
Distribution of the contact-potential difference local values over the gate area of MOS structures
Przewlocki, Henryk M., Kudla, Andrzej, Brzezinska, Danuta, Massoud, Hisham Z.
Published in Microelectronic engineering (01.04.2004)
Published in Microelectronic engineering (01.04.2004)
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Journal Article
Conference Proceeding
The outstanding properties of graphene-insulator-semiconductor (GIS) test structures for photoelectric determination of semiconductor devices band diagram
Piskorski, Krzysztof, Passi, Vikram, Ruhkopf, Jasper, Lemme, Max C., Przewlocki, Henryk M.
Published in 2017 International Conference of Microelectronic Test Structures (ICMTS) (01.03.2017)
Published in 2017 International Conference of Microelectronic Test Structures (ICMTS) (01.03.2017)
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Conference Proceeding
Internal photoemission technique for high-k oxide/semiconductor band offset determination: The influence of semiconductor bulk properties
Engstrom, Olof, Przewlocki, Henryk M., Mitrovic, Ivona Z., Hall, Stephen
Published in 2014 44th European Solid State Device Research Conference (ESSDERC) (01.09.2014)
Published in 2014 44th European Solid State Device Research Conference (ESSDERC) (01.09.2014)
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Conference Proceeding
Photoelectric Measurements of the Modern Graphene-Insulator-Semiconductor (GIS) Test Structures
Piskorski, Krzysztof, Przewlocki, Henryk M., Passi, Vikram, Ruhkopf, Jasper, Lemme, Max C.
Published in 2018 25th International Conference "Mixed Design of Integrated Circuits and System" (MIXDES) (01.06.2018)
Published in 2018 25th International Conference "Mixed Design of Integrated Circuits and System" (MIXDES) (01.06.2018)
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Conference Proceeding
Investigation of gate edge effect on interface trap density in 3C–SiC MOS capacitors
Gutt, T., Małachowski, T., Przewłocki, H.M., Engström, O., Bakowski, M., Esteve, R.
Published in Materials science & engineering. B, Solid-state materials for advanced technology (01.09.2012)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (01.09.2012)
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Journal Article