Circuit relevant HCS lifetime assessments at single transistors with emulated variable loads
Schlunder, Christian, Proebster, F., Berthold, J., Puschkarsky, Katja, Georgakos, Georg, Gustin, Wolfgang, Reisinger, Hans
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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