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Impact of Material and Process Variations on the Distribution of Multicrystalline Silicon PERC Cell Efficiencies
Wasmer, Sven, Greulich, Johannes, Hoffler, Hannes, Wohrle, Nico, Demant, Matthias, Fertig, Fabian, Rein, Stefan
Published in IEEE journal of photovoltaics (01.01.2017)
Published in IEEE journal of photovoltaics (01.01.2017)
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Journal Article
Semi-analytical current source modeling of near-threshold operating logic cells considering process variations
Xie, Qing, Cui, Tiansong, Wang, Yanzhi, Nazarian, Shahin, Pedram, Massoud
Published in Proceedings - IEEE International Conference on Computer Design (01.10.2013)
Published in Proceedings - IEEE International Conference on Computer Design (01.10.2013)
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Conference Proceeding
Custom on-chip sensors for post-silicon failing path isolation in the presence of process variations
Li, Min, Davoodi, Azadeh, Xie, Lin
Published in Proceedings of the Conference on Design, Automation and Test in Europe (12.03.2012)
Published in Proceedings of the Conference on Design, Automation and Test in Europe (12.03.2012)
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Conference Proceeding
Custom on-chip sensors for post-silicon failing path isolation in the presence of process variations
Min Li, Davoodi, Azadeh, Lin Xie
Published in 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2012)
Published in 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2012)
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Conference Proceeding
Single IRB Concerns Include IT Limitations, Process Variations
Published in Medical ethics advisor
(01.01.2022)
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Journal Article
Process Variability—Technological Challenge and Design Issue for Nanoscale Devices
Lorenz, Jürgen, Bär, Eberhard, Barraud, Sylvain, Brown, Andrew R., Evanschitzky, Peter, Klüpfel, Fabian, Wang, Liping
Published in Micromachines (Basel) (01.01.2019)
Published in Micromachines (Basel) (01.01.2019)
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Journal Article
A methodology to improve timing yield in the presence of process variations
Raj, Sreeja, Vrudhula, Sarma B. K., Wang, Janet
Published in 2004 41st Conference Design Automation (01.01.2004)
Published in 2004 41st Conference Design Automation (01.01.2004)
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Conference Proceeding
Overcoming Variations in Nanometer-Scale Technologies
Sapatnekar, S S
Published in IEEE journal on emerging and selected topics in circuits and systems (01.03.2011)
Published in IEEE journal on emerging and selected topics in circuits and systems (01.03.2011)
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Journal Article
Gate-level modelling of NBTI-induced delays under process variations
Copetti, Thiago, Medeiros, Guilherme, Bolzani Poehls, Leticia, Vargas, Fabian, Kostin, Sergei, Jenihhin, Maksim, Raik, Jaan, Ubar, Raimund
Published in 2016 17th Latin-American Test Symposium (LATS) (01.04.2016)
Published in 2016 17th Latin-American Test Symposium (LATS) (01.04.2016)
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Conference Proceeding
Method and apparatus for designing and manufacturing electronic circuits subject to process variations
Year of Publication 05.11.2013
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Patent
Analysis of ultra-low voltage digital circuits over process variations
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Conference Proceeding
Performance and impact of process variations in Tunnel-FET ultra-low voltage digital circuits
Alioto, Massimo, Esseni, David
Published in 2014 27th Symposium on Integrated Circuits and Systems Design (SBCCI) (01.09.2014)
Published in 2014 27th Symposium on Integrated Circuits and Systems Design (SBCCI) (01.09.2014)
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Conference Proceeding
Within-die process variations: How accurately can they be statistically modeled?
Hargreaves, B., Hult, H., Reda, S.
Published in 2008 Asia and South Pacific Design Automation Conference (01.01.2008)
Published in 2008 Asia and South Pacific Design Automation Conference (01.01.2008)
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Conference Proceeding
Time-domain performance bound analysis for analog and interconnect circuits considering process variations
Tan Yu, Tan, Sheldon X.-D, Yici Cai, Puying Tang
Published in Proceedings of the ASP-DAC ... Asia and South Pacific Design Automation Conference (01.01.2014)
Published in Proceedings of the ASP-DAC ... Asia and South Pacific Design Automation Conference (01.01.2014)
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Conference Proceeding