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Elektronické časopisy od vydavatelství Emerald tvoří velmi cennou kolekci titulů zejména pro oblast managementu, ekonomiky, sociálních věd, ale i knihovnictví a mnoha dalších disciplín.

Modular service-oriented platform architecture - a key enabler to SoC design quality

Modular service-oriented platform architecture - a key enabler to SoC design quality

by Suoranta, Risto
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)

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Conference Proceeding

TBNM - Transistor-Level Boundary Model for Fast Gate-Level Noise Analysis of Macro Blocks

TBNM - Transistor-Level Boundary Model for Fast Gate-Level Noise Analysis of Macro Blocks

by Zejda, Jindrich, Ding, Li
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)

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Conference Proceeding

Analysis and experimental results of an FPGA-based strategy for fast production test of high resolution ADCs

Analysis and experimental results of an FPGA-based strategy for fast production test of high resolution ADCs

by Venuto, Daniela De, Reyneri, Leonardo
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)

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Conference Proceeding

Partial Selective Encryption: An Improved System for Protecting VLSI Design Data in the OASIS format

Partial Selective Encryption: An Improved System for Protecting VLSI Design Data in the OASIS format

by Kulkarni, Anand P., Grebinski, Thomas J.
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)

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Conference Proceeding

A Mixed Boundary Element Method for Extracting Frequency- Inductances of 3D Interconnects

A Mixed Boundary Element Method for Extracting Frequency- Inductances of 3D Interconnects

by Yan, Changhao, Yu, Wenjian, Wang, Zeyi
Published in Proceedings of the 7th International Symposium on Quality Electronic Design (27.03.2006)

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Conference Proceeding

Low-leakage SRAM Design with Dual V_t Transistors

Low-leakage SRAM Design with Dual V_t Transistors

by Amelifard, Behnam, Pedram, Massoud, Fallah, Farzan
Published in Proceedings of the 7th International Symposium on Quality Electronic Design (27.03.2006)

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Conference Proceeding

Design ofWindow Comparators for Integrator-Based Capacitor Array Testing Circuits

Design ofWindow Comparators for Integrator-Based Capacitor Array Testing Circuits

by Laknaur, Amit, Wang, Haibo
Published in Proceedings of the 7th International Symposium on Quality Electronic Design (27.03.2006)

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Conference Proceeding

Organizing Committee

Organizing Committee

Published in Proceedings of the 7th International Symposium on Quality Electronic Design (27.03.2006)

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Conference Proceeding

Author Index

Author Index

Published in Proceedings of the 7th International Symposium on Quality Electronic Design (27.03.2006)

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Conference Proceeding

Steering/Advisory Committee

Steering/Advisory Committee

Published in Proceedings of the 7th International Symposium on Quality Electronic Design (27.03.2006)

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Conference at a Glance

Conference at a Glance

Published in Proceedings of the 7th International Symposium on Quality Electronic Design (27.03.2006)

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Participating Organizations

Participating Organizations

Published in Proceedings of the 7th International Symposium on Quality Electronic Design (27.03.2006)

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Conference Proceeding

Best Paper Award

Best Paper Award

Published in Proceedings of the 7th International Symposium on Quality Electronic Design (27.03.2006)

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Conference Proceeding

Call for Papers

Call for Papers

Published in Proceedings of the 7th International Symposium on Quality Electronic Design (27.03.2006)

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Technical Subcommittees

Technical Subcommittees

Published in Proceedings of the 7th International Symposium on Quality Electronic Design (27.03.2006)

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Conference Proceeding

Session EP1: Power Management and Optimization Challenges for Sub 90nm CMOS Designs- What is the Real Cost of Long Battery Life?

Session EP1: Power Management and Optimization Challenges for Sub 90nm CMOS Designs- What is the Real Cost of Long Battery Life?

by Santarini, Mike, Chatterjee, Pallab
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)

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Conference Proceeding

Future Memory Technology Trends and Challenges

Future Memory Technology Trends and Challenges

by Kim, Changhyun
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)

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Conference Proceeding

Tutorial 1: Emerging Technologies for VLSI Design

Tutorial 1: Emerging Technologies for VLSI Design

by Joshi, Rajiv, Banerjee, Kaustav, DeHon, Andre
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)

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Conference Proceeding

Who is really responsible for quality throughout the design process?

Who is really responsible for quality throughout the design process?

by Wilson, Ron, Overhauser, David
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)

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Conference Proceeding

Adding Manufacturability to the Quality of Results

Adding Manufacturability to the Quality of Results

by Camposano, Raul
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)

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Conference Proceeding

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