Design of a Single Event Upset (SEU) Mitigation Technique for Programmable Devices
Baloch, S., Arslan, T., Stoica, A.
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding
Using Abstraction for Efficient Formal Verification of Pipelined Processors with Value Prediction
Velev, Miroslav N.
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding
Analysis of Pulse Signaling for Low-Power On-Chip Global Bus Design
Chen, Min, Cao, Yu
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding
A Non-Volatile Embedded Memory for High Temperature Automotive and High-Retention Applications
Thomas, M., Pathak, J., Payne, J., Leisenberger, F., Wachmann, E., Schatzberger, G., Wiesner, A., Schrems, M.
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding
Critical Path Analysis Considering Temperature, Power Supply Variations and Temperature Induced Leakage
Li, Peng
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding
Information Theoretic Capacity of Long On-chip Interconnects in the Presence of Crosstalk
Singhal, Rohit, Choi, Gwan S., Mahapatra, Rabi
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding
Data Replication in Banked DRAMs for Reducing Energy Consumption
Ozturk, Ozcan, Kandemir, Mahmut
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding
Transistor-Level Optimization of Supergates
Kagaris, Dimitris, Haniotakis, Themistoklis
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding
Compact Reduced Order Modeling for Multiple-Port Interconnects
Liu, Pu, Tan, Sheldon X. -D., McGaughy, Bruce, Wu, Lifeng
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding
Via Distribution Model for Yield Estimation
Uezono, Takumi, Okada, Kenichi, Masu, Kazuya
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding
Efficient Model Update for General Link-Insertion Networks
Feng, Zhuo, Li, Peng, Hu, Jiang
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding
Dual-Vt Design of FPGAs for Subthreshold Leakage Tolerance
Kumar, Akhilesh, Anis, Mohab
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding
Method to Evaluate Cable Discharge Event (CDE) Reliability of Integrated Circuits in CMOS Technology
Lai, Tai-Xiang, Ker, Ming-Dou
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding
Efficient Multiphase Test Set Embedding for Scan-based Testing
Kalligeros, E., Kavousianos, X., Nikolos, D.
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding
Enhancement of Signal Integrity and Power Integrity with Embedded Capacitors in High-Speed Packages
Srinivasan, K., Muthana, P., Mandrekar, R., Engin, E., Choi, J., Swaminathan, M.
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding
Accurate Thermal Analysis Considering Nonlinear Thermal Conductivity
Ramalingam, Anand, Pan, David Z., Liu, Frank, Nassif, Sani R.
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding
Sensing Margin Analysis of MLC Flash Memories Using a Novel Unified Statistical Model
Kim, Young-Gu, Lee, Sang-Hoon, Kim, Dae-Han, Im, Jae-Woo, Yu, Sung-Eun, Kim, Dae-Wook, Park, Young-Kwan, Kong, Jeong-Taek
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding
LOTUS: Leakage Optimization under Timing Uncertainty for Standard-cell designs
Bhardwaj, Sarvesh, Cao, Yu, Vrudhula, Sarma
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding
System-level process variability compensation on memory organizations of dynamic applications: a case study
Sanz, C., Prieto, M., Papanikolaou, A., Miranda, M., Catthoor, F.
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding
An Improved Method for Identifying Linear Dependencies in Path Delay Faults
Flanigan, E., Haniotakis, T., Tragoudas, S.
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (27.03.2006)
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Conference Proceeding