Post-bond test techniques for TSVs with crosstalk faults in 3D ICs
Yu-Jen Huang, Jin-Fu Li, Che-Wei Chou
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
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Conference Proceeding
Wireless power link design using silicon-embedded inductors for brain-machine interface
Wu, Rongxiang, Raju, Salahuddin, Chan, Mansun, Sin, Johnny K.O., Yue, C. Patrick
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
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Conference Proceeding
Data mining based prediction paradigm and its applications in design automation
Abadir, M. S., Sumikawa, N., Wen Chen, Wang, Li-C
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
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Conference Proceeding
Advances in computing
Ya-Qin Zhang
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
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Conference Proceeding
The 2012 ARM powered compute subsystem - delivering the smart handheld platform
Whitfield, T.
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
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Conference Proceeding
Review of 3D high density storage class memory (SCM) architecture
Lee, B.
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
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Conference Proceeding
A 363-µW/fps power-aware green multimedia processor for mobile applications
Chi-Cheng Ju, Yung-Chang Chang, Chih-Ming Wang, ChunChia Chen, Hue-Min Lin, Chia-Yun Cheng, Chiu, Fred, Sheng-Jen Wang, Tsu-Ming Liu, Chung-Hung Tsai
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
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Conference Proceeding
A slew rate self-adjusting 2×VDD output buffer With PVT compensation
Chih-Lin Chen, Hsin-Yuan Tseng, Ron-Chi Kuo, Chua-Chin Wang
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
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Conference Proceeding
Technology and design challenges for smartphone SOCs
Loh, K. L.
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
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Conference Proceeding
DVB-T2 LDPC decoder with perfect conflict resolution
Xiongxin Zhao, Zhixiang Chen, Xiao Peng, Dajiang Zhou, Goto, S.
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
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Conference Proceeding
Disruptive technologies for the future generation smart systems
Lemmens, P.
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
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Conference Proceeding
Powerful smartphone solutions unleashing new technology innovations
Huang, G.
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
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Conference Proceeding
Foreword
An-Yeu Wu, Wang, Li-C.
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
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Conference Proceeding
The evolution of fabless IC industry in China: Past, present, and future
Ko, P. K., Yue, C. P.
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
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Conference Proceeding
3D-IC BISR for stacked memories using cross-die spares
Chun-Chuan Chi, Yung-Fa Chou, Ding-Ming Kwai, Yu-Ying Hsiao, Cheng-Wen Wu, Yu-Tsao Hsing, Li-Ming Denq, Tsung-Hsiang Lin
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
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Conference Proceeding
Time-delay integration readout with adjacent pixel signal transfer for CMOS image sensor
Kuo-Wei Cheng, Chin Yin, Chih-Cheng Hsieh, Wen-Hsu Chang, Hann-Huei Tsai, Chin-Fong Chiu
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
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Conference Proceeding
An energy-efficient ultra-wideband transmitter with an FIR pulse-shaping filter
Wei-Ning Liu, Tsung-Hsien Lin
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Design, Automation and Test (01.04.2012)
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Conference Proceeding