by Bucher, M., Lallement, C., Enz, C.C.
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)

by Bastos, J., Steyaert, M., Graindourze, B., Sansen, W.
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)

by Newsam, M.I., Walton, A.J., Fallon, M.
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)

by Nanver, L.K., Goudena, E.J.G., Slabbekoorn, J.
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)

by Joe-Sun Choi, In-Sool Chung
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)

by Sasaki, M., Ito, H., Horiuchi, T.
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)

by Elzinga, H.
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)

by Czech, I., Manea, J., Roggen, J., Huyberechts, G., Stals, L., De Schepper, L.
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)

by Bolt, M., Cantatore, E., Socha, M., Aussems, C., Solo, J.
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)

by Peeters, E., Steyaert, M., Sansen, W.
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)

by von Arx, M., Paul, O., Baltes, H.
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)

by Lui, A., Margesin, B., Zanini, V., Zen, M., Soncini, G., Martinoia, S.
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)

by Lovett, S.J., Clancy, R., Welten, M., Mathewson, A., Mason, B.
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)

by Nikiforov, A.Y., Chumakov, V.I., Skorobogatov, O.
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)

by Shyh-Chyi Wong, Kuo-Hua Pan, Dye-Jyun Ma, Liang, M.S., Tseng, P.N.
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)

by Santander, J., Lozano, M., Gotz, A., Cane, C., Lora-Tamayo, E.
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)

by Bastos, J., Steyaert, M., Graindourze, B., Sansen, W.
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)

by Satya, A.V.S.
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)

by Gaston, G.J., Myler, P.
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)

by Tellez, J.R., Clarke, R.W.
Published in Proceedings of International Conference on Microelectronic Test Structures (1996)