On macroplaces in Petri nets
Karatkevich, Andrei
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding
RTL-TLM equivalence checking based on simulation
Bombieri, Nicola, Fummi, Franco, Pravadelli, Graziano
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding
Test suite consistency verification
Boroday, Sergiy, Petrenko, Alexandre, Ulrich, Andreas
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding
Digital lock detector for PLL
Melikyan, Vazgen, Hovsepyan, Aristakes, Ishkhanyan, Mkrtich, Hakobyan, Tigran
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding
Utilizing HDL simulation engines for accelerating design and test processes
Farajipour, Najmeh, Hosseini, S Behdad, Navabi, Zainalabedin
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding
Reliable NoC architecture utilizing a robust rerouting algorithm
Alaghi, Armin, Sedghi, Mahshid, Karimi, Naghmeh, Fathy, Mahmood, Navabi, Zainalabedin
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding
HotSpot : Visualizing dynamic power consumption in RTL designs
English, T, Man, K L, Popovici, E, Schellekens, M P
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding
A novel timing-driven placement algorithm using smooth timing analysis
Ayupov, Andrey, Kraginskiy, Leonid
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding
Concurrent processes synchronisation in statecharts for FPGA implementation
Łabiak, Grzegorz, Adamski, M
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding
Performance evaluation of In-Circuit Testing on QCA based circuits
Kazemi-fard, Nasim, Ebrahimpour, Maryam, Rahimi, Mostafa, Tehrani, Mohammad, Navi, Keivan
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding
Characterization of CMOS sequential standard cells for defect based voltage testing
Wielgus, A, Pleskacz, W A
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding
Partitioning, floor planning, detailed placement and routing techniques for schematic generation of analog netlist
Garg, B, Agrawal, A, Sehgal, R, Singh, A, Khanna, M
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding
Parity prediction method for on-line testing of a Barrel-shifter
Drozd, A, Antoshchuk, S, Rucinski, A, Martinuk, A
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding
Coverage-directed verification of microprocessor units based on cycle-accurate contract specifications
Kamkin, Alexander
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding
An optimized CLP-based technique for generating propagation sequences
Fummi, F, Guarnieri, V, Marconcini, C, Pravadelli, G
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding
An advanced method for synthesizing TLM2-based interfaces
Hatami, Nadereh, Navabi, Zainalabedin
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding
Automating Hardware/Software partitioning using dependency Graph
Malekshahi, Somayeh, Sedghi, Mahshid, Navabi, Zainalabedin
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding
Vector-logical diagnosis method for SOC functionalities
Hahanov, Vladimir, Guz, Olesya, Kulbakova, Natalya, Davydov, Maxim
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding
An IEEE 1500 compatible wrapper architecture for testing cores at transaction level
Refan, F, Prinetto, P, Navabi, Z
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding
Testability analysis method for hardware and software based on assertion libraries
Kaminska, Maryna, Prikhodchenko, Roman, Kubirya, Artem, Mocar, Pavel
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Published in Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08) (01.10.2008)
Get full text
Conference Proceeding