Measurement of minority carrier diffusion length and lifetime in SOI devices by flying spot laser scanner as a function of residual misfit
Baumgart, H., Egloff, R., Arnold, E., Letavic, T.J., Merchant, S., Mukherjee, S., Bhimnathwala, H.
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
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Conference Proceeding
Non-destructive characterization techniques for SOI substrates
Hovel, H., Freeouf, J., Beyer, K., Sadana, D., Chu, S.
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
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Conference Proceeding
SOI technology outlook for sub-0.25 /spl mu/m CMOS, challenges and opportunities
Davari, B., Hovel, H.J., Shahidi, G.G.
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
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Conference Proceeding
Behavior of contact-silicided TFSOI gate-structures
Foerstner, J., Jones, J., Huang, M., Bor-Yuan Hwang, Racanelli, M., Tsao, J., Theodore, N.D.
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
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Conference Proceeding
Formation of oxidation induced stacking sacrificial thinning of SIMOX materials
Giles, L.F., Nejim, A., Marsh, C.D., Hemment, P.L.F., Booker, G.R.
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
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Conference Proceeding
Photo-injection studies of buried oxide layers in SIMOX and BESOI structures
Revesz, A.G., Afanas'ev, V.V., Hughes, H.L.
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
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Conference Proceeding
High temperature testing of SOI devices to 400/spl deg/C
Grzybowski, R.R., Tyson, S.M.
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
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Conference Proceeding
Short-channel effects in deep-submicrometer SOI MOSFETS
Su, L.T., Jacobs, J.B., Chung, J.E., Antoniadis, D.A.
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
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Conference Proceeding
Improvement of the breakdown field of SIMOX buried oxide layers
Nakashima, S., Harada, M., Tsuchiya, T.
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
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Conference Proceeding
Effect of single vs. multiple implant processing on defect types and densities in SIMOX
Venables, D., Krause, S.J., Park, J.C., Lee, J.D., Roitman, P.
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
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Conference Proceeding
A feasibility study of SiC on oxide by wafer bonding and layer transferring
Tong, Q.-Y., Gosele, U., Yuan, C., Steckl, A.J.
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
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Conference Proceeding
A 1-M bit SRAM on SIMOX material
Hsindao Lu, Yee, E., Hite, L., Houston, T., Yea-Dean Sheu, Rajgopal, R., Shen, C.C., Jeong-Mo Hwang, Pollack, G.
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
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Conference Proceeding