Search Results - "Proceedings - International Test Conference" :: K.UTB vyhledávací portál

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Influence-Directed Explanations for Deep Convolutional Networks

by Leino, Klas, Sen, Shayak, Datta, Anupam, Fredrikson, Matt, Li, Linyi
Published in Proceedings - International Test Conference (01.10.2018)

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Evaluating Vulnerability of Chiplet-Based Systems to Contactless Probing Techniques

by Deric, Aleksa, Mitard, Kyle, Tajik, Shahin, Holcomb, Daniel
Published in Proceedings - International Test Conference (03.11.2024)

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Scalable Hardware Trojan Activation by Interleaving Concrete Simulation and Symbolic Execution

by Ahmed, Alif, Farahmandi, Farimah, Iskander, Yousef, Mishra, Prabhat
Published in Proceedings - International Test Conference (01.10.2018)

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WM-Graph: Graph-Based Approach for Wafermap Analytics

by Yang, Min Jian, Zeng, Yueling Jenny, Wang, Li-C.
Published in Proceedings - International Test Conference (03.11.2024)

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Functionally-Possible Gate-Exhaustive Bridging Faults

by Pomeranz, Irith
Published in Proceedings - International Test Conference (03.11.2024)

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LESER-2: Detailed Consideration in Latch Design under Process Migration for Prevention of Single-Event Double-Node Upsets

by Liu, Alan S.-M., Wang, Lowry P.-T., Wen, Charles H.-P., Chiueh, Herming
Published in Proceedings - International Test Conference (03.11.2024)

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Predictive Testing for Aging in SRAMs and Mitigation

by Lin, Yunkun, Li, Mingye, Gupta, Sandeep
Published in Proceedings - International Test Conference (03.11.2024)

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Probe Card Ground Noise Canceling Circuit

by Lee, Seongkwan, Kang, Minho, Park, Cheolmin, Won, Jun Yeon, Choi, Jaemoo, Park, Chanyeol, Park, Sunyong, Yang, Woonphil
Published in Proceedings - International Test Conference (03.11.2024)

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A graph-based algorithm for NVM address decoders testing

by Scaramuzza, Pierre, Kern, Thomas, Coppetta, Matteo, Grossi, Alessandro, Ullmann, Rudolf
Published in Proceedings - International Test Conference (03.11.2024)

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Scan SerDes for Multi-die Packages

by Upadhyay, Saurabh, Tokuz, Ahmet
Published in Proceedings - International Test Conference (03.11.2024)

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FAT-RABBIT: Fault-Aware Training towards Robustness AgainstBit-flip Based Attacks in Deep Neural Networks

by Pourmehrani, Hossein, Bahrami, Javad, Nooralinejad, Parsa, Pirsiavash, Hamed, Karimi, Naghmeh
Published in Proceedings - International Test Conference (03.11.2024)

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Wafer-View Defect-Pattern-Prominent GDBN Method Using MetaFormer Variant

by Li, Shu-Wen, Yen, Chia-Heng, Chang, Shuo-Wen, Chu, Ying-Hua, Wu, Kai-Chiang, Chao, Mango Chia-Tso
Published in Proceedings - International Test Conference (03.11.2024)

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Deterministic In-Fleet Scan Test for a Cloud Computing Platform

by Trock, Dan, Mahadevan, Subramanian, Mukherjee, Nilanjan, Harrison, Lee, Rajski, Janusz, Tyszer, Jerzy
Published in Proceedings - International Test Conference (03.11.2024)

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Enhancing Functional Verification with Dynamic Instruction Generation by Exploiting Processor Runtime States

by Liu, Anlin, Lu, Tianyao, Xi, Yuhao, Liu, Yangfan, Liu, Peng
Published in Proceedings - International Test Conference (03.11.2024)

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Efficient Built-In Self-Test Scheme for Inter-Die Interconnects of Chiplet-Based Chips

by Huang, Yi-Chun, Lin, Pei-Yun, Li, Jin-Fu, Fu, Hong-Siang, Lee, Yung-Ping
Published in Proceedings - International Test Conference (03.11.2024)

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Delay Monitoring Under Different PVT Corners for Test and Functional Operation

by Addepalli, Hari, Wu, Jiezhong, Mukherjee, Nilanjan, Pomeranz, Irith, Rajski, Janusz
Published in Proceedings - International Test Conference (03.11.2024)

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TEACH: Outlier Oriented Testing of Analog/Mixed-Signal Circuits Using One-class Hyperdimensional Clustering

by Komarraju, Suhasini, Mejri, Mohamed, Chatterjee, Abhijit, Natarajan, Suriyaprakash, Goteti, Prashant
Published in Proceedings - International Test Conference (03.11.2024)

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Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs

by Xun, Hanzhi, Fieback, Moritz, Yaldagard, Mohammad Amin, Yuan, Sicong, Hua, Erbing, Aziza, Hassen, Taouil, Mottaqiallah, Hamdioui, Said
Published in Proceedings - International Test Conference (03.11.2024)

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Defects, Fault Modeling, and Test Development Framework for FeFETs

by Wang, Changhao, Yuan, Sicong, Xun, Hanzhi, Li, Chaobo, Taouil, Mottaqiallah, Fieback, Moritz, Chen, Danyang, Li, Xiuyan, Wang, Lin, Cantoro, Riccardo, Yin, Chujun, Hamdioui, Said
Published in Proceedings - International Test Conference (03.11.2024)

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Small-Bridging-Fault-Aware Built-In-Self-Repair for Cycle-Based Interconnects in a Chiplet Design Using Adjusted Pulse-Vanishing Test

by Lai, Chi, Huang, Shi-Yu
Published in Proceedings - International Test Conference (03.11.2024)

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