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Artificial Bee Colony Optimization to Accelerate High-Speed Serial I/O Tx Equalization
Sanchez-Martinez, Cesar A., Lopez-Meyer, Paulo, Viveros-Wacher, Andres
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
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Gradient Attention Map Based Verification of Deep Convolutional Neural Networks with Application to X-ray Image Datasets
Milani, Omid Halimi, Nikho, Amanda, Mills, Lauren, Tliba, Marouane, Cetin, Ahmet Enis, Elnagar, Mohammed H.
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
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CED-HDC: Lightweight Concurrent Error Detection for Reliable Hyperdimensional Computing
Roodsari, Mahboobe Sadeghipour, Meyers, Vincent, Tahoori, Mehdi
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
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Reliable Board-Level Degradation Prediction with Monotonic Segmented Regression under Noisy Measurement
Yin, Yuxuan, Chen, Rebecca, Thukral, Varun, He, Chen, Li, Peng
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
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AI for Test : (Innovation Practices Track)
Chaudhuri, Arjun, Ahmed, Soyed Tuhin
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
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ChipMnd: LLMs for Agile Chip Design
Firouzi, Farshad, Pan, David Z., Gu, Jiaqi, Farahani, Bahar, Chaudhuri, Jayeeta, Yin, Ziang, Ma, Pingchuan, Domanski, Peter, Chakrabarty, Krishnendu
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
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Garblet: Multi-party Computation for Protecting Chiplet-based Systems
Hashemi, Mohammad, Tajik, Shahin, Ganji, Fatemeh
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
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CLIP: A Structural Approach to Cut Points Matching for Logic Equivalence Checking
Ankireddy, Dinesh Reddy, Paria, Sudipta, Dasgupta, Aritra, Ray, Sandip, Bhunia, Swarup
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
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Timing-Verification Test Generation Targeting Small Delay Defects
Wu, Jiezhong, Mukherjee, Nilanjan, Pomeranz, Irith, Tsai, Kun-Han, Rajski, Janusz
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
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MicroFI: TensorFlow Lite based Fault Injection Framework for Microcontrollers
de Melo, Leonardo Alexandrino, Possamai Bastos, Rodrigo, Bosio, Alberto
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
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Fault Modeling and Testing of ReRAM-based CAM Array
Hezayyin, Haneen G., Mayahinia, Mahta, Tahoori, Mehdi
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
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SALTY: Explainable Artificial Intelligence Guided Structural Analysis for Hardware Trojan Detection
Mahfuz, Tanzim, Gaikwad, Pravin, Suha, Tasneem, Bhunia, Swarup, Chakraborty, Prabuddha
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
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ML-based Adaptive Wafer Sort to Preserve Diagnostic Information
Liu, Yun-Sheng, Liu, Min-Hsin, Li, James Chien-Mo
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
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Security Verification and Secure Testing Solutions
Aftabjahani, Sohrab, Pradeep, Wilson
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
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GLLaMoR: Graph-based Logic Locking by Large Language Models for Enhanced Robustness
Saha, Akashdeep, Basu Roy, Prithwish, Knechtel, Johann, Karri, Ramesh, Sinanoglu, Ozgur, Alrahis, Lilas
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
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Defect Analysis and Built-In-Self-Test for Chiplet Interconnects in Fan-out Wafer-Level Packaging
Bhoumik, Partho, Bailey, Christopher, Chakrabarty, Krishnendu
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
Published in Proceedings - IEEE VLSI Test Symposium (28.04.2025)
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