Automated Multi-Class Seizure-Type Classification System Using EEG Signals and Machine Learning Algorithms
Abirami, S., Tikaram, Kathiravan, M., Yuvaraj, Rajamanickam, Menon, Ramshekhar N., Thomas, John, Karthick, P. A., Prince, A. Amalin, Ronickom, Jac Fredo Agastinose
Published in IEEE access (2024)
Published in IEEE access (2024)
Get full text
Journal Article
Digital Microscopic Image Sensing and Processing for Leather Species Identification
Varghese, Anjli, Jain, Sahil, Prince, A. Amalin, Jawahar, Malathy
Published in IEEE sensors journal (01.09.2020)
Published in IEEE sensors journal (01.09.2020)
Get full text
Journal Article
A Study on Deep Learning Models for Automatic Species Identification from Novel Leather Images
Varghese, Anjli, Jawahar, Malathy, Prince, A Amalin
Published in 2023 IEEE International Conference on Industry 4.0, Artificial Intelligence, and Communications Technology (IAICT) (13.07.2023)
Published in 2023 IEEE International Conference on Industry 4.0, Artificial Intelligence, and Communications Technology (IAICT) (13.07.2023)
Get full text
Conference Proceeding
Time-frequency based feature extraction for the analysis of vibroarthographic signals
Nalband, Saif, Valliappan, C.A., Prince, A. Amalin, Agrawal, Anita
Published in Computers & electrical engineering (01.07.2018)
Published in Computers & electrical engineering (01.07.2018)
Get full text
Journal Article
Design of configurable multi-mode trigger unit
George, Gibin Chacko, Prince, A. Amalin, Buch, J.J.U., Pathak, Surya K.
Published in Measurement : journal of the International Measurement Confederation (01.06.2019)
Published in Measurement : journal of the International Measurement Confederation (01.06.2019)
Get full text
Journal Article
Characteristics of Arbitrary Ramp Generator: A Tuning Voltage Setup for the FMCW Reflectometer
George, Gibin Chacko, Bittu, N., Buch, J. J. U., Prince, A. Amalin, Goveas, Neena, Pathak, Surya K.
Published in IEEE transactions on instrumentation and measurement (01.06.2020)
Published in IEEE transactions on instrumentation and measurement (01.06.2020)
Get full text
Journal Article