A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors
Priji, A, Dankovi, D, Vra ar, Lj, Mani, I, Priji, Z, Stojadinovi, N
Published in Measurement science & technology (01.08.2012)
Published in Measurement science & technology (01.08.2012)
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Journal Article
NBTI and irradiation related degradation mechanisms in power VDMOS transistors
Stojadinović, N., Djorić-Veljković, S., Davidović, V., Golubović, S., Stanković, S., Prijić, A., Prijić, Z., Manić, I., Danković, D.
Published in Microelectronics and reliability (01.09.2018)
Published in Microelectronics and reliability (01.09.2018)
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Journal Article
A review of pulsed NBTI in P-channel power VDMOSFETs
Danković, D., Manić, I., Prijić, A., Davidović, V., Prijić, Z., Golubović, S., Djorić-Veljković, S., Paskaleva, A., Spassov, D., Stojadinović, N.
Published in Microelectronics and reliability (01.03.2018)
Published in Microelectronics and reliability (01.03.2018)
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Journal Article
NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions
MANIC, I, DANKOVIC, D, PRIJIC, A, DAVIDOVIC, V, DJORIC-VELJKOVIC, S, GOLUBOVIC, S, PRIJIC, Z, STOJADINOVIC, N
Published in Microelectronics and reliability (01.09.2011)
Published in Microelectronics and reliability (01.09.2011)
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Conference Proceeding
Recoverable and permanent components of VT shift in pulsed NBT stressed p-channel power VDMOSFETs
Danković, D., Stojadinović, N., Prijić, Z., Manić, I., Prijić, A.
Published in 2014 29th International Conference on Microelectronics Proceedings - MIEL 2014 (01.05.2014)
Published in 2014 29th International Conference on Microelectronics Proceedings - MIEL 2014 (01.05.2014)
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Conference Proceeding
Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress
STOJADINOVIC, N, DANKOVIC, D, MANIC, I, PRIJIC, A, DAVIDOVIC, V, DJORIC-VELJKOVIC, S, GOLUBOVIC, S, PRIJIC, Z
Published in Microelectronics and reliability (01.09.2010)
Published in Microelectronics and reliability (01.09.2010)
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Journal Article
Conference Proceeding
Effectiveness of Microporous Ceramic Heatsinks in Thermal Energy Harvesting Systems
Marjanovic, M., Stojkovic, A., Vracar, J., Prijic, A., Prijic, Z.
Published in 2023 IEEE 33rd International Conference on Microelectronics (MIEL) (16.10.2023)
Published in 2023 IEEE 33rd International Conference on Microelectronics (MIEL) (16.10.2023)
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Conference Proceeding
AADL modeling of M2M terminal
Prijić, A, Prijić, Z, Vuc̆ković, D, Stanimirović, A
Published in 2010 27th International Conference on Microelectronics Proceedings (01.05.2010)
Published in 2010 27th International Conference on Microelectronics Proceedings (01.05.2010)
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Conference Proceeding
Design Techniques for Wireless Sensor Network Nodes Powered by Ambient Energy Harvesting
Prijic, Z., Prijic, A., Vracar, Lj
Published in 2019 IEEE 31st International Conference on Microelectronics (MIEL) (01.09.2019)
Published in 2019 IEEE 31st International Conference on Microelectronics (MIEL) (01.09.2019)
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Conference Proceeding
A SPICE Compatible Spatial Equivalent Circuit Model of the Heatsink
Marjanovic, M., Stojkovic, A., Prijic, A., Dankovic, D., Prijic, Z.
Published in 2021 IEEE 32nd International Conference on Microelectronics (MIEL) (12.09.2021)
Published in 2021 IEEE 32nd International Conference on Microelectronics (MIEL) (12.09.2021)
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Conference Proceeding
A New Method of Evaluation of Liquidus Temperatures of Ternary Alloys
Prijic, A., Prijic, Z., Pesic, B.
Published in 2006 25th International Conference on Microelectronics (2006)
Published in 2006 25th International Conference on Microelectronics (2006)
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Conference Proceeding
Effects of Bias Temperature Stress and Irradiation in Commercial p-Channel Power VDMOS Transistors
Veljkovic, S., Mitrovic, N., Djoric-Veljkovic, S., Davidovic, V., Manic, I., Golubovic, S., Paskaleva, A., Spassov, D., Prijic, Z., Prijic, A., Stankovic, S., Dankovic, D.
Published in 2021 IEEE 32nd International Conference on Microelectronics (MIEL) (12.09.2021)
Published in 2021 IEEE 32nd International Conference on Microelectronics (MIEL) (12.09.2021)
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Conference Proceeding
Design and Optimization of S-Type Thermal Cutoffs
Prijic, A., Prijic, Z., Pesic, B., Pantic, D., Ristic, S., Mancic, D., Petrusic, Z.
Published in IEEE transactions on components and packaging technologies (01.12.2008)
Published in IEEE transactions on components and packaging technologies (01.12.2008)
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Journal Article
Degradation of p-channel power VDMOSFETs under pulsed NBT stress
Djorić-Veljković, S, Danković, D, Prijić, A, Manić, I, Davidović, V, Golubović, S, Prijić, Z, Stojadinović, N
Published in 2010 27th International Conference on Microelectronics Proceedings (01.05.2010)
Published in 2010 27th International Conference on Microelectronics Proceedings (01.05.2010)
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Conference Proceeding
Modelling of threshold voltage shift in pulsed NBT stressed P-channel power VDMOSFETs
Dankovic, D., Manic, I., Stojadinovic, N., Prijic, Z., Djoric-Veljkovic, S., Davidovic, V., Prijic, A., Paskaleva, A., Spassov, D., Golubovic, S.
Published in 2017 IEEE 30th International Conference on Microelectronics (MIEL) (01.10.2017)
Published in 2017 IEEE 30th International Conference on Microelectronics (MIEL) (01.10.2017)
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Conference Proceeding
Determination of tetracycline residues in foods
Kaufmann, A, Pacciarelli, B, Prijic, A, Ryser, B, Roth, S
Published in Mitteilungen aus Lebensmitteluntersuchung und Hygiene (Switzerland) (1999)
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Published in Mitteilungen aus Lebensmitteluntersuchung und Hygiene (Switzerland) (1999)
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