Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications
Mitrović, N., Veljković, S., Davidović, V., Djorić-Veljković, S., Golubović, S., Živanović, E., Prijić, Z., Danković, D.
Published in Microelectronics and reliability (01.11.2022)
Published in Microelectronics and reliability (01.11.2022)
Get full text
Journal Article
NBTI and irradiation related degradation mechanisms in power VDMOS transistors
Stojadinović, N., Djorić-Veljković, S., Davidović, V., Golubović, S., Stanković, S., Prijić, A., Prijić, Z., Manić, I., Danković, D.
Published in Microelectronics and reliability (01.09.2018)
Published in Microelectronics and reliability (01.09.2018)
Get full text
Journal Article
A review of pulsed NBTI in P-channel power VDMOSFETs
Danković, D., Manić, I., Prijić, A., Davidović, V., Prijić, Z., Golubović, S., Djorić-Veljković, S., Paskaleva, A., Spassov, D., Stojadinović, N.
Published in Microelectronics and reliability (01.03.2018)
Published in Microelectronics and reliability (01.03.2018)
Get full text
Journal Article
NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions
MANIC, I, DANKOVIC, D, PRIJIC, A, DAVIDOVIC, V, DJORIC-VELJKOVIC, S, GOLUBOVIC, S, PRIJIC, Z, STOJADINOVIC, N
Published in Microelectronics and reliability (01.09.2011)
Published in Microelectronics and reliability (01.09.2011)
Get full text
Journal Article
Conference Proceeding
Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress
STOJADINOVIC, N, DANKOVIC, D, MANIC, I, PRIJIC, A, DAVIDOVIC, V, DJORIC-VELJKOVIC, S, GOLUBOVIC, S, PRIJIC, Z
Published in Microelectronics and reliability (01.09.2010)
Published in Microelectronics and reliability (01.09.2010)
Get full text
Journal Article
Conference Proceeding
Niobium doping effect on BaTiO3 structure and dielectric properties
Paunovic, V., Mitic, V.V., Djordjevic, M., Prijic, Z.
Published in Ceramics international (15.04.2020)
Published in Ceramics international (15.04.2020)
Get full text
Journal Article
Microstructure and dielectric properties of Dy/Mn doped BaTiO3 ceramics
Paunovic, V., Mitic, V.V., Prijic, Z., Zivkovic, Lj
Published in Ceramics international (01.04.2014)
Published in Ceramics international (01.04.2014)
Get full text
Journal Article
A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors
Priji, A, Dankovi, D, Vra ar, Lj, Mani, I, Priji, Z, Stojadinovi, N
Published in Measurement science & technology (01.08.2012)
Published in Measurement science & technology (01.08.2012)
Get full text
Journal Article
Recoverable and permanent components of VT shift in pulsed NBT stressed p-channel power VDMOSFETs
Danković, D., Stojadinović, N., Prijić, Z., Manić, I., Prijić, A.
Published in 2014 29th International Conference on Microelectronics Proceedings - MIEL 2014 (01.05.2014)
Published in 2014 29th International Conference on Microelectronics Proceedings - MIEL 2014 (01.05.2014)
Get full text
Conference Proceeding
Low-noise silicon avalanche photodiodes fabricated in conventional CMOS technologies
Rochas, A., Pauchard, A.R., Besse, P.-A., Pantic, D., Prijic, Z., Popovic, R.S.
Published in IEEE transactions on electron devices (01.03.2002)
Published in IEEE transactions on electron devices (01.03.2002)
Get full text
Journal Article
Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method
N. Mitrović, D. Danković, B. Ranđelović, Z. Prijić, N. Stojadinović
Published in Informacije MIDEM (Spletna izd.) (30.11.2020)
Published in Informacije MIDEM (Spletna izd.) (30.11.2020)
Get full text
Journal Article
The determination of zero temperature coefficient point in CMOS transistors
Prijić, Z.D., Dimitrijev, S.S., Stojadinović, N.D.
Published in Microelectronics and reliability (1992)
Published in Microelectronics and reliability (1992)
Get full text
Journal Article
Effectiveness of Microporous Ceramic Heatsinks in Thermal Energy Harvesting Systems
Marjanovic, M., Stojkovic, A., Vracar, J., Prijic, A., Prijic, Z.
Published in 2023 IEEE 33rd International Conference on Microelectronics (MIEL) (16.10.2023)
Published in 2023 IEEE 33rd International Conference on Microelectronics (MIEL) (16.10.2023)
Get full text
Conference Proceeding
AADL modeling of M2M terminal
Prijić, A, Prijić, Z, Vuc̆ković, D, Stanimirović, A
Published in 2010 27th International Conference on Microelectronics Proceedings (01.05.2010)
Published in 2010 27th International Conference on Microelectronics Proceedings (01.05.2010)
Get full text
Conference Proceeding
Design Techniques for Wireless Sensor Network Nodes Powered by Ambient Energy Harvesting
Prijic, Z., Prijic, A., Vracar, Lj
Published in 2019 IEEE 31st International Conference on Microelectronics (MIEL) (01.09.2019)
Published in 2019 IEEE 31st International Conference on Microelectronics (MIEL) (01.09.2019)
Get full text
Conference Proceeding
A SPICE Compatible Spatial Equivalent Circuit Model of the Heatsink
Marjanovic, M., Stojkovic, A., Prijic, A., Dankovic, D., Prijic, Z.
Published in 2021 IEEE 32nd International Conference on Microelectronics (MIEL) (12.09.2021)
Published in 2021 IEEE 32nd International Conference on Microelectronics (MIEL) (12.09.2021)
Get full text
Conference Proceeding
Analysis of temperature dependence of CMOS transistors' threshold voltage
Prijić, Z.D., Dimitrijev, S.S., Stojadinović, N.D.
Published in Microelectronics and reliability (1991)
Published in Microelectronics and reliability (1991)
Get full text
Journal Article
A New Method of Evaluation of Liquidus Temperatures of Ternary Alloys
Prijic, A., Prijic, Z., Pesic, B.
Published in 2006 25th International Conference on Microelectronics (2006)
Published in 2006 25th International Conference on Microelectronics (2006)
Get full text
Conference Proceeding